Silicon and zinc telluride nanoparticles synthesized by pulsed laser ablation: Size distributions and nanoscale structure

Douglas H. Lowndes, Christopher M. Rouleau, T. Thundat, G. Duscher, E. A. Kenik, S. J. Pennycook

Research output: Contribution to journalArticlepeer-review

66 Scopus citations

Abstract

Size distributions of Si and ZnTe nanoparticles produced by low energy density ArF (193 nm) pulsed laser ablation into ambient gases were measured as a function of the gas pressure and target-sub strate separation, D ts , using atomic force microscopy (AFM) and high resolution scanning electron microscopy (HRSEM). For low energy density (E d = 1.04 J/cm 2 ) ablation of Si into He at pressures of 0.5, 1.5, 4 and 10 Torr, large nanoparticles were most numerous at D ts = 10 mm, with smaller nanoparticles found at 20 mm and 40 mm. For each D ts value a maximum of the mean nanoparticle diameter occurred for a He pressure near 6 Torr, in contrast to other recent measurements in which the size of Si nanoparticles increased monotonically with the He pressure. High resolution Z-contrast transmission electron microscopy (HRZTEM) and electron energy loss spectroscopy (EELS) revealed that ZnTe nanoparticles formed by ablation into nitrogen at E d = 0.74 J/cm 2 consisted of a crystalline ZnTe core surrounded by an amorphous ZnO shell. Growth defects and surface steps were clearly visible in the ZnTe crystalline core. The dependencies of the mean diameter of ZnTe nanocrystals on nitrogen pressure and D ts were qualitatively similar to those found for Si in He.

Original languageEnglish
Pages (from-to)355-361
Number of pages7
JournalApplied Surface Science
Volume127-129
DOIs
StatePublished - May 1998

Funding

The authors thank P.H. Fleming for assistance with analysis of the HRSEM nanoparticle images. This research was sponsored by the Oak Ridge National Laboratory, managed by Lockheed Martin Energy Research for the U.S. Department of Energy under contract DE-AC05-96OR22464.

FundersFunder number
Lockheed Martin Energy Research
U.S. Department of EnergyDE-AC05-96OR22464
Oak Ridge National Laboratory

    Keywords

    • Atomic force microscopy
    • Nanocrystal
    • Nanoparticle
    • Pulsed laser ablation
    • Pulsed laser deposition
    • Scanning electron microscopy
    • Si
    • Size distribution
    • Transmission electron microscopy
    • Z-contrast
    • ZnTe

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