Abstract
Titanium nitride (TiN) coatings fabricated through reactive sputtering feature a suite of parameters capable of altering the microstructure and properties. Here, we explore the influence of bipolar pulsed direct current (DC) magnetron sputtering on microstructure evolution of TiN coating, in comparison to conventional DC sputtering. The implementation of a pulsed DC voltage profile promotes a drastic texture change from randomly oriented polycrystals to (1 1 1) textured TiN coatings across the full range of pulse frequencies on various Si substrates, including amorphous SiO2. Additionally, higher pulse frequencies promote significant grain size reduction, accompanied with corresponding increases in hardness and wear resistance. The potential mechanism for this microstructural and texture evolution is also explored.
Original language | English |
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Article number | 157709 |
Journal | Applied Surface Science |
Volume | 635 |
DOIs | |
State | Published - Oct 30 2023 |
Funding
This work is supported by Advanced Energy Industries, Inc. The ASTAR crystal orientation system in TEM microscope is supported by ONR-DURIP award N00014-17-1-2921. J. B. and H.W. acknowledge the support from the U.S. National Science Foundation (DMR-2016453) for the related nitride film property measurements. We would also like to acknowledge the microscopy center of the School of Materials Engineering at Purdue University. This work is supported by Advanced Energy Industries, Inc. The ASTAR crystal orientation system in TEM microscope is supported by ONR-DURIP award N00014-17-1-2921. J. B. and H.W. acknowledge the support from the U.S. National Science Foundation (DMR-2016453) for the related nitride film property measurements. We would also like to acknowledge the microscopy center of the School of Materials Engineering at Purdue University.
Keywords
- Nanoscratch testing
- Pulse DC magnetron sputtering
- Titanium nitride
- Transmission electron microscopy