SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability

Xiaofeng Dong, Hui Li, Sandro Martin, Sanghun Kim, Dongwoo Han, Fang Z. Peng, Jinyeong Moon, Yuan Li, M. S. Chinthavali, R. S.K. Moorthy

Research output: Contribution to conferencePaperpeer-review

5 Scopus citations

Abstract

A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.

Original languageEnglish
Pages1525-1531
Number of pages7
DOIs
StatePublished - 2022
Event37th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2022 - Houston, United States
Duration: Mar 20 2022Mar 24 2022

Conference

Conference37th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2022
Country/TerritoryUnited States
CityHouston
Period03/20/2203/24/22

Funding

ACKNOWLEDGMENT This project was supported by Oak Ridge National Laboratory (ORNL) funded through the Department of Energy (DOE) - Office of Electricity’s (OE), Transformer Resilience and Advanced Components (TRAC) program led by the program manager Andre Pereira.

Keywords

  • Active gate drive
  • Communication
  • Health monitoring
  • Intelligent power stage
  • Prognosis & diagnosis
  • SiC
  • Zero-voltage-ride-through

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