SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability

Xiaofeng Dong, Hui Li, Sandro Martin, Sanghun Kim, Dongwoo Han, Fang Z. Peng, Jinyeong Moon, Yuan Li, M. S. Chinthavali, R. S.K. Moorthy

Research output: Contribution to conferencePaperpeer-review

4 Scopus citations

Abstract

A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.

Original languageEnglish
Pages1525-1531
Number of pages7
DOIs
StatePublished - 2022
Event37th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2022 - Houston, United States
Duration: Mar 20 2022Mar 24 2022

Conference

Conference37th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2022
Country/TerritoryUnited States
CityHouston
Period03/20/2203/24/22

Funding

ACKNOWLEDGMENT This project was supported by Oak Ridge National Laboratory (ORNL) funded through the Department of Energy (DOE) - Office of Electricity’s (OE), Transformer Resilience and Advanced Components (TRAC) program led by the program manager Andre Pereira.

FundersFunder number
U.S. Department of Energy
Oak Ridge National Laboratory
Office of Electricity

    Keywords

    • Active gate drive
    • Communication
    • Health monitoring
    • Intelligent power stage
    • Prognosis & diagnosis
    • SiC
    • Zero-voltage-ride-through

    Fingerprint

    Dive into the research topics of 'SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability'. Together they form a unique fingerprint.

    Cite this