Si nano-meshes investigated using transmission electron microscopy

G. D. Lian; M. E. Curtis; P. R. Larson; K. L. Hobbs; J. C. Keay; M. B. Johnson; D. A. Blom; L. F. Allard

doi:10.1017/S1431927604886318

Si nano-meshes investigated using transmission electron microscopy

G. D. Lian
, M. E. Curtis
, P. R. Larson
, K. L. Hobbs
, J. C. Keay
, M. B. Johnson
, D. A. Blom
, L. F. Allard

Applied Microanalysis and Thermophysics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	352-353
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604886318
State	Published - 2004

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10.1017/S1431927604886318

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@article{d02bfe22db3c4ff396eaaaf23e853c51,

title = "Si nano-meshes investigated using transmission electron microscopy",

author = "Lian, \{G. D.\} and Curtis, \{M. E.\} and Larson, \{P. R.\} and Hobbs, \{K. L.\} and Keay, \{J. C.\} and Johnson, \{M. B.\} and Blom, \{D. A.\} and Allard, \{L. F.\}",

year = "2004",

doi = "10.1017/S1431927604886318",

language = "English",

volume = "10",

pages = "352--353",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Si nano-meshes investigated using transmission electron microscopy

AU - Lian, G. D.

AU - Curtis, M. E.

AU - Larson, P. R.

AU - Hobbs, K. L.

AU - Keay, J. C.

AU - Johnson, M. B.

AU - Blom, D. A.

AU - Allard, L. F.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4544286377

U2 - 10.1017/S1431927604886318

DO - 10.1017/S1431927604886318

M3 - Article

AN - SCOPUS:4544286377

SN - 1431-9276

VL - 10

SP - 352

EP - 353

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Si nano-meshes investigated using transmission electron microscopy

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