Si nano-meshes investigated using transmission electron microscopy

G. D. Lian; M. E. Curtis; P. R. Larson; K. L. Hobbs; J. C. Keay; M. B. Johnson; D. A. Blom; L. F. Allard

doi:10.1017/S1431927604886318

Si nano-meshes investigated using transmission electron microscopy

G. D. Lian, M. E. Curtis, P. R. Larson, K. L. Hobbs, J. C. Keay, M. B. Johnson, D. A. Blom, L. F. Allard

Nuclear Energy Materials Microanalysis

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	352-353
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604886318
State	Published - 2004

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10.1017/S1431927604886318

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title = "Si nano-meshes investigated using transmission electron microscopy",

author = "Lian, {G. D.} and Curtis, {M. E.} and Larson, {P. R.} and Hobbs, {K. L.} and Keay, {J. C.} and Johnson, {M. B.} and Blom, {D. A.} and Allard, {L. F.}",

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doi = "10.1017/S1431927604886318",

language = "English",

volume = "10",

pages = "352--353",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Si nano-meshes investigated using transmission electron microscopy

AU - Lian, G. D.

AU - Curtis, M. E.

AU - Larson, P. R.

AU - Hobbs, K. L.

AU - Keay, J. C.

AU - Johnson, M. B.

AU - Blom, D. A.

AU - Allard, L. F.

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=4544286377&partnerID=8YFLogxK

U2 - 10.1017/S1431927604886318

DO - 10.1017/S1431927604886318

M3 - Article

AN - SCOPUS:4544286377

SN - 1431-9276

VL - 10

SP - 352

EP - 353

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Si nano-meshes investigated using transmission electron microscopy

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