Abstract
Electron energy loss spectroscopy (EELS) enables direct exploration of plasmonic phenomena at the nanometer level. To isolate individual plasmon modes, linear unmixing methods can be used to separate different physical mechanisms, but in larger and more complex systems the interpretability of the components becomes uncertain. Here, infrared plasmonic resonances in self-assembled heterogeneous monolayer films of doped-semiconductor nanoparticles are examined beyond linear unmixing techniques, and both supervised and unsupervised machine-learning-based analyses of hyperspectral EELS datasets are demonstrated. In the supervised approach, a human operator labels a small number of pixels in the hyperspectral dataset corresponding to features of interest which are then propagated across the entire dataset. In the unsupervised approach, non-linear autoencoders are used to create a highly-reduced latent-space representation of the dataset, within which insight into the relevant physics can be gleaned from straightforward distance metrics that do not depend on operator input and bias. The advantage of these approaches is that the labeling separates physical mechanisms without altering the data, enabling robust analyses of the influence of heterogeneities in mesoscale complex systems.
Original language | English |
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Article number | 2001808 |
Journal | Advanced Optical Materials |
Volume | 9 |
Issue number | 13 |
DOIs | |
State | Published - Jul 5 2021 |
Funding
This effort (electron microscopy, feature extraction) is based upon work supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Materials Sciences and Engineering Division (K.M.R., S.V.K.) and was performed and partially supported (J.A.H., M.Z., R.K.V.) at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. S.H.C and D.J.M. acknowledge (NSF CHE-1905263, and CDCM, an NSF MRSEC DMR-1720595), the Welch Foundation (F-1848), and the Fulbright Program (IIE-15151071). Electron microscopy was performed using instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the DOE and sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy. This effort (electron microscopy, feature extraction) is based upon work supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Materials Sciences and Engineering Division (K.M.R., S.V.K.) and was performed and partially supported (J.A.H., M.Z., R.K.V.) at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. S.H.C and D.J.M. acknowledge (NSF CHE‐1905263, and CDCM, an NSF MRSEC DMR‐1720595), the Welch Foundation (F‐1848), and the Fulbright Program (IIE‐15151071). Electron microscopy was performed using instrumentation within ORNL's Materials Characterization Core provided by UT‐Battelle, LLC, under Contract No. DE‐AC05‐00OR22725 with the DOE and sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT‐Battelle, LLC, for the U.S. Department of Energy.
Funders | Funder number |
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CDCM | MRSEC DMR‐1720595 |
CNMS | NSF CHE‐1905263 |
Oak Ridge National Laboratory | |
National Science Foundation | CHE-1905263 |
U.S. Department of Energy | |
Directorate for Mathematical and Physical Sciences | 1720595 |
Welch Foundation | IIE‐15151071, F‐1848 |
Office of Science | |
Basic Energy Sciences | |
Oak Ridge National Laboratory | |
Division of Materials Sciences and Engineering |
Keywords
- electron energy loss spectroscopy
- machine learning
- nanoparticle arrays
- nanophotonics
- plasmonics
- scanning transmission electron microscopy