Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

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@misc{fcfc1a39464d4afd86c91aa3c697853e,

title = "Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes",

author = "Thomas Miller and Bruce Patton and Charles Weber and Kursat Bekar",

note = "ORNL/TM-2014/316 Unclassified, Non Sensitive",

year = "2014",

month = oct,

doi = "10.2172/1185618",

language = "American English",

type = "Other",

}