Self-Pixelation through Fracture in VO2Thin Films

Laura Rodríguez, Elena Del Corro, Michele Conroy, Kalani Moore, Felip Sandiumenge, Neus Domingo, José Santiso, Gustau Catalan

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Vanadium dioxide (VO2) is an archetypal Mott material with a metal-insulator transition (MIT) at near room temperature. In thin films, this transition is affected by substrate-induced strain but as film thickness increases, the strain is gradually relaxed and the bulk properties are recovered. Epitaxial films of VO2 on (001)-oriented rutile titanium dioxide (TiO2) relax substrate strain by forming a network of fracture lines that crisscross the film along well-defined crystallographic directions. This work shows that the electronic properties associated with these lines result in a pattern that resembles a "street map"of fully strained metallic VO2 blocks separated by insulating VO2 stripes. Each block of VO2 is thus electronically self-insulated from its neighbors, and its MIT can be locally induced optically with a laser, or electronically via the tip of a scanning probe microscope so that the films behave functionally as self-patterned pixel arrays.

Original languageEnglish
Pages (from-to)1433-1439
Number of pages7
JournalACS Applied Electronic Materials
Volume2
Issue number5
DOIs
StatePublished - May 26 2020
Externally publishedYes

Funding

This work was supported from the Spanish Ministry of Economy, Industry and Competitiveness (project: MAT2016-77100-C2-1-P), the Catalan AGAUR agency for 2017SGR, and the Science Foundation Ireland (SFI 16/US/3344). ICN2 is funded by the CERCA programme/Generalitat de Catalunya and the Severo Ochoa programme (SEV-2017-0706). L.R. particularly acknowledges the support of the Severo Ochoa program and ICN2 for her Ph.D. grant. E.d.C. acknowledges the Spanish “Juan de la Cierva” grant (JC-2015-25201) and the research project FIS2017-85787. M.C. acknowledges funding from SFI Industry Fellowship (18/IF/6282).

FundersFunder number
CERCA programme/Generalitat de CatalunyaSEV-2017-0706, 18/IF/6282, FIS2017-85787, JC-2015-25201
Science Foundation IrelandSFI 16/US/3344
Agència de Gestió d'Ajuts Universitaris i de Recerca2017SGR
Ministerio de Economía, Industria y Competitividad, Gobierno de EspañaMAT2016-77100-C2-1-P

    Keywords

    • cracks
    • metal-insulator transition
    • pixelation
    • scanning Kelvin probe microscopy
    • thin films
    • vanadium dioxide

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