Self-consistent, unbiased exclusion methods of emittance analysis

Martin P. Stockli; R. F. Welton; R. Keller

Self-consistent, unbiased exclusion methods of emittance analysis

Martin P. Stockli, R. F. Welton, R. Keller

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainly. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.

Original language	English
Pages	527-529
Number of pages	3
State	Published - 2003
Externally published	Yes
Event	PAC 2003 - Proceedings of the 2003 IEEE Particle Accelerator Conference - Portland, OR, United States Duration: May 12 2003 → May 16 2003

Conference

Conference	PAC 2003 - Proceedings of the 2003 IEEE Particle Accelerator Conference
Country/Territory	United States
City	Portland, OR
Period	05/12/03 → 05/16/03

Cite this

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title = "Self-consistent, unbiased exclusion methods of emittance analysis",

abstract = "We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainly. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.",

author = "Stockli, {Martin P.} and Welton, {R. F.} and R. Keller",

year = "2003",

language = "English",

pages = "527--529",

note = "PAC 2003 - Proceedings of the 2003 IEEE Particle Accelerator Conference ; Conference date: 12-05-2003 Through 16-05-2003",

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TY - CONF

T1 - Self-consistent, unbiased exclusion methods of emittance analysis

AU - Stockli, Martin P.

AU - Welton, R. F.

AU - Keller, R.

PY - 2003

Y1 - 2003

N2 - We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainly. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.

AB - We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainly. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.

UR - http://www.scopus.com/inward/record.url?scp=4143120204&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:4143120204

SP - 527

EP - 529

T2 - PAC 2003 - Proceedings of the 2003 IEEE Particle Accelerator Conference

Y2 - 12 May 2003 through 16 May 2003

ER -

Self-consistent, unbiased exclusion methods of emittance analysis

Abstract

Conference

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