Segregation-induced grain boundary premelting in nickel-doped tungsten

J. Luo, V. K. Gupta, D. H. Yoon, H. M. Meyer

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Abstract

High-resolution transmission electron microscopy and Auger spectroscopy have revealed the formation of nanometer-thick, Ni-enriched, disordered, grain boundary layers in Ni-doped W specimens at 95 °C below the bulk eutectic temperature. The stabilization of subeutectic liquid-like grain boundary cores in this model two-component metallic alloy is phenomenologically analogous to the long-sought phenomenon of grain boundary premelting. The existence of such disordered nanostructures at metallic grain boundaries provides insights to resolve several long-standing controversies in interpreting the unique grain boundary diffusionmigration kinetics and mechanical properties for this system, and can have technological importance for a broader range of materials.

Original languageEnglish
Article number231902
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number23
DOIs
StatePublished - 2005
Externally publishedYes

Funding

This research is in part supported by a Clemson RGC award and an ORAU Ralph E. Powe Junior Faculty Enhancement award. Auger analysis was sponsored by the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Freedom Car and Vehicle Technologies, as part of the HTML User Program, ORNL, managed by UT-Battelle, LLC, for the U.S. DOE under Contract No. DE-AC05-00OR22725. The authors thank Dr. J. Hudson, Dr. Y. Ding, and Y. Berta for some assistance regarding TEM, and Dr. R. M. Cannon and Professor Y.-M. Chiang for insightful discussions.

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