Segmenting Atomic Layers in Images of Atomically Resolved van der Waals Bilayers

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)396-397
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

This work was supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division (ERKCS81) and was performed at the Center for Nanophase Materials Sciences (CNMS), Oak Ridge National Laboratory (ORNL). This research used birthright cloud resources of the Compute and Data Environment for Science (CADES) at the Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC05-00OR22725.

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