Original language | English |
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Pages (from-to) | 396-397 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 30 |
Issue number | 2024 |
DOIs | |
State | Published - Jul 24 2024 |
Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024 |
Segmenting Atomic Layers in Images of Atomically Resolved van der Waals Bilayers
Austin C. Houston, Sumner B. Harris, Jordan A. Hachtel, Yiling Yu, David B. Geohegan, Kai Xiao, Gerd Duscher
Research output: Contribution to journal › Conference article › peer-review