Secondary ion mass spectrometry for Mg tracer diffusion: Issues and solutions

Jay Tuggle; Andrew Giordani; Nagraj Kulkarni; Bruce Warmack; Jerry Hunter

doi:10.1002/sia.5618

Secondary ion mass spectrometry for Mg tracer diffusion: Issues and solutions

Jay Tuggle
, Andrew Giordani
, Nagraj Kulkarni
, Bruce Warmack
, Jerry Hunter

Sensors and Electronics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.

Original language	English
Pages (from-to)	291-293
Number of pages	3
Journal	Surface and Interface Analysis
Volume	46
Issue number	S1
DOIs	https://doi.org/10.1002/sia.5618
State	Published - Nov 1 2014

Keywords

Annealing
Diffusion
Induced topography
Mg alloys
Mg diffusivities
SIMS
Self-diffusion
Topography formation
Tracer diffusion

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10.1002/sia.5618

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title = "Secondary ion mass spectrometry for Mg tracer diffusion: Issues and solutions",

abstract = "A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.",

keywords = "Annealing, Diffusion, Induced topography, Mg alloys, Mg diffusivities, SIMS, Self-diffusion, Topography formation, Tracer diffusion",

author = "Jay Tuggle and Andrew Giordani and Nagraj Kulkarni and Bruce Warmack and Jerry Hunter",

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T1 - Secondary ion mass spectrometry for Mg tracer diffusion

T2 - Issues and solutions

AU - Tuggle, Jay

AU - Giordani, Andrew

AU - Kulkarni, Nagraj

AU - Warmack, Bruce

AU - Hunter, Jerry

PY - 2014/11/1

Y1 - 2014/11/1

N2 - A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.

AB - A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.

KW - Annealing

KW - Diffusion

KW - Induced topography

KW - Mg alloys

KW - Mg diffusivities

KW - SIMS

KW - Self-diffusion

KW - Topography formation

KW - Tracer diffusion

UR - https://www.scopus.com/pages/publications/84912070601

U2 - 10.1002/sia.5618

DO - 10.1002/sia.5618

M3 - Article

AN - SCOPUS:84912070601

SN - 0142-2421

VL - 46

SP - 291

EP - 293

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - S1

ER -

Secondary ion mass spectrometry for Mg tracer diffusion: Issues and solutions

Abstract

Keywords

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