Secondary ion mass spectrometry for Mg tracer diffusion: Issues and solutions

Jay Tuggle, Andrew Giordani, Nagraj Kulkarni, Bruce Warmack, Jerry Hunter

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.

Original languageEnglish
Pages (from-to)291-293
Number of pages3
JournalSurface and Interface Analysis
Volume46
Issue numberS1
DOIs
StatePublished - Nov 1 2014

Funding

Keywords

  • Annealing
  • Diffusion
  • Induced topography
  • Mg alloys
  • Mg diffusivities
  • SIMS
  • Self-diffusion
  • Topography formation
  • Tracer diffusion

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