Abstract
A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self-diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.
Original language | English |
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Pages (from-to) | 291-293 |
Number of pages | 3 |
Journal | Surface and Interface Analysis |
Volume | 46 |
Issue number | S1 |
DOIs | |
State | Published - Nov 1 2014 |
Funding
Keywords
- Annealing
- Diffusion
- Induced topography
- Mg alloys
- Mg diffusivities
- SIMS
- Self-diffusion
- Topography formation
- Tracer diffusion