Secondary electron generation by low energy ion beams

D. C. Joy, Y. Lin, H. H. Meyers, Hendrix Demers, D. E. Newbury

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	1446-1447
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606062751
State	Published - Aug 2006

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title = "Secondary electron generation by low energy ion beams",

author = "Joy, \{D. C.\} and Y. Lin and Meyers, \{H. H.\} and Hendrix Demers and Newbury, \{D. E.\}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606062751",

language = "English",

volume = "12",

pages = "1446--1447",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Secondary electron generation by low energy ion beams

AU - Joy, D. C.

AU - Lin, Y.

AU - Meyers, H. H.

AU - Demers, Hendrix

AU - Newbury, D. E.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750894269

U2 - 10.1017/S1431927606062751

DO - 10.1017/S1431927606062751

M3 - Article

AN - SCOPUS:33750894269

SN - 1431-9276

VL - 12

SP - 1446

EP - 1447

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -