Scanning surface potential microscopy of spore adhesion on surfaces

I. Lee, E. Chung, H. Kweon, S. Yiacoumi, C. Tsouris

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

The adhesion of spores of Bacillus anthracis - the cause of anthrax and a likely biological threat - to solid surfaces is an important consideration in cleanup after an accidental or deliberate release. However, because of safety concerns, directly studying B. anthracis spores with advanced instrumentation is problematic. As a first step, we are examining the electrostatic potential of Bacillus thuringiensis (Bt), which is a closely related species that is often used as a simulant to study B. anthracis. Scanning surface potential microscopy (SSPM), also known as Kelvin probe force microscopy (KPFM), was used to investigate the influence of relative humidity (RH) on the surface electrostatic potential of Bt that had adhered to silica, mica, or gold substrates. AFM/SSPM side-by-side images were obtained separately in air, at various values of RH, after an aqueous droplet with spores was applied on each surface and allowed to dry before measurements. In the SSPM images, a negative potential on the surface of the spores was observed compared with that of the substrates. The surface potential decreased as the humidity increased. Spores were unable to adhere to a surface with an extremely negative potential, such as mica.

Original languageEnglish
Pages (from-to)271-276
Number of pages6
JournalColloids and Surfaces B: Biointerfaces
Volume92
DOIs
StatePublished - Apr 1 2012

Funding

This work is supported by the Defense Threat Reduction Agency under Grant number HDTRA1-07-1-0035 . The authors are also thankful to Dr. Marsha Savage for editing the manuscript.

FundersFunder number
Defense Threat Reduction AgencyHDTRA1-07-1-0035

    Keywords

    • Atomic force microscopy
    • KPFM
    • Kelvin probe force microscopy
    • SSPM
    • Scanning surface potential microscopy
    • Spore adhesion
    • Spores

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