Scanning Probe Microscopy -Forces and Currents in the Nanoscale World

Brian J. Rodriguez, Roger Proksch, Peter Maksymovych, Sergei V. Kalinin

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

3 Scopus citations
Original languageEnglish
Title of host publicationHandbook of Nanoscopy
PublisherWiley-VCH
Pages539-614
Number of pages76
Volume1
ISBN (Print)9783527317066
DOIs
StatePublished - May 23 2012

Keywords

  • Atomic force microscopy
  • Band excitation
  • Force-based measurements
  • Phase-locked loops
  • Scanning probe microscopy
  • Scanning tunneling microscopy
  • Tip effects
  • Tunneling conductance

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