Scalable analysis techniques for microprocessor performance counter metrics

Dong H. Ahn, Jeffrey S. Vetter

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

31 Scopus citations

Abstract

Contemporary microprocessors provide a rich set of integrated performance counters that allow application developers and system architects alike the opportunity to gather important information about workload behaviors. Current techniques for analyzing data produced from these counters use raw counts, ratios, and visualization techniques help users make decisions about their application performance. While these techniques are appropriate for analyzing data from one process, they do not scale easily to new levels demanded by contemporary computing systems. Very simply, this paper addresses these concerns by evaluating several multivariate statistical techniques on these datasets. We find that several techniques, such as statistical clustering, can automatically extract important features from the data. These derived results can, in turn, be fed directly back to an application developer, or used as input to a more comprehensive performance analysis environment, such as a visualization or an expert system.

Original languageEnglish
Title of host publicationProceedings of the IEEE/ACM SC 2002 Conference, SC 2002
PublisherAssociation for Computing Machinery
ISBN (Electronic)076951524X
DOIs
StatePublished - 2002
Event2002 IEEE/ACM Conference on Supercomputing, SC 2002 - Baltimore, United States
Duration: Nov 16 2002Nov 22 2002

Publication series

NameProceedings of the International Conference on Supercomputing
Volume2002-November

Conference

Conference2002 IEEE/ACM Conference on Supercomputing, SC 2002
Country/TerritoryUnited States
CityBaltimore
Period11/16/0211/22/02

Funding

This work was performed under the auspices of the U.S. Department of Energy by the University of California, Lawrence Livermore National Laboratory under contract No. W-7405-Eng-48. T his paper is available as LLNL T echnical Report UCRL-JC-148058.

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