Role of relative humidity in atomic force microscopy imaging

T. Thundat; X. Y. Zheng; G. Y. Chen; R. J. Warmack

doi:10.1016/0039-6028(93)90152-A

Role of relative humidity in atomic force microscopy imaging

T. Thundat, X. Y. Zheng, G. Y. Chen, R. J. Warmack

Research output: Contribution to journal › Letter › peer-review

145 Scopus citations

Abstract

Atomic force microscope images were found to be influenced significantly by relative humidity. Higher relative humidity produces higher adhesion forces and reduced resolution. Atomic resolution on mica was abruptly lost when the relative humidity was slowly decreased while scanning. This effect could be reversed by increasing the relative humidity or by increasing the cantilever force. At higher relative humidities the lateral force on the tip was found to increase significantly with increasing scanning speed.

Original language	English
Pages (from-to)	L939-L943
Journal	Surface Science
Volume	294
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(93)90152-A
State	Published - Sep 1 1993
Externally published	Yes

Funding

We thank R.C. Reddick for useful discussions and comments.T his researchw as sponsoredb y Director’s Research and Developmenta t ORNL and the Office of Health and EnvironmentalR e-search,U S Departmento f Energy under contract No. DE-AC05-840R21400w ith Martin Marietta Energy SystemsI,n c.

Funders	Funder number
Office of Health
U S Departmento f Energy
Oak Ridge National Laboratory

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10.1016/0039-6028(93)90152-A

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title = "Role of relative humidity in atomic force microscopy imaging",

abstract = "Atomic force microscope images were found to be influenced significantly by relative humidity. Higher relative humidity produces higher adhesion forces and reduced resolution. Atomic resolution on mica was abruptly lost when the relative humidity was slowly decreased while scanning. This effect could be reversed by increasing the relative humidity or by increasing the cantilever force. At higher relative humidities the lateral force on the tip was found to increase significantly with increasing scanning speed.",

author = "T. Thundat and Zheng, {X. Y.} and Chen, {G. Y.} and Warmack, {R. J.}",

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AU - Thundat, T.

AU - Zheng, X. Y.

AU - Chen, G. Y.

AU - Warmack, R. J.

PY - 1993/9/1

Y1 - 1993/9/1

N2 - Atomic force microscope images were found to be influenced significantly by relative humidity. Higher relative humidity produces higher adhesion forces and reduced resolution. Atomic resolution on mica was abruptly lost when the relative humidity was slowly decreased while scanning. This effect could be reversed by increasing the relative humidity or by increasing the cantilever force. At higher relative humidities the lateral force on the tip was found to increase significantly with increasing scanning speed.

AB - Atomic force microscope images were found to be influenced significantly by relative humidity. Higher relative humidity produces higher adhesion forces and reduced resolution. Atomic resolution on mica was abruptly lost when the relative humidity was slowly decreased while scanning. This effect could be reversed by increasing the relative humidity or by increasing the cantilever force. At higher relative humidities the lateral force on the tip was found to increase significantly with increasing scanning speed.

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DO - 10.1016/0039-6028(93)90152-A

M3 - Letter

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VL - 294

SP - L939-L943

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Role of relative humidity in atomic force microscopy imaging

Abstract

Funding

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