Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

E. Strelcov, Y. Kim, J. C. Yang, Y. H. Chu, P. Yu, X. Lu, S. Jesse, S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V ac is a necessary step to establish the veracity of PFM hysteresis measurements.

Original languageEnglish
Article number192902
JournalApplied Physics Letters
Volume101
Issue number19
DOIs
StatePublished - Nov 5 2012

Funding

This research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. Y.H.C. acknowledges the support of the National Science Council, Republic of China, under Contract No. NSC-100-2119-M-009-003.

FundersFunder number
National Science Council, Republic of ChinaNSC-100-2119-M-009-003
Scientific User Facilities Division
U.S. Department of Energy
Basic Energy Sciences
Oak Ridge National Laboratory

    Fingerprint

    Dive into the research topics of 'Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy'. Together they form a unique fingerprint.

    Cite this