Abstract
The relationship structure and hardness of sputter-deposited boron carbide films was studied and a direct correlation between the presence of intericosahedral chains and hardness was established. The changes in the structure were characterized in terms of chemical composition, chemical bonding, concentration of defects and trapped impurities and were induced by annealing. The infrared and Raman measurements revealed the creation of intericosahedral chains for higher annealing temperatures. The results show that the intensity of the infrared band at 1500 cm -1 is related to the hardness and the postdeposition annealing is a pathway to enhance the mechanical properties of boron carbide films.
Original language | English |
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Pages (from-to) | 4173-4175 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 21 |
DOIs | |
State | Published - May 24 2004 |
Externally published | Yes |