Robust probes for high resolution chemical detection and imaging

Rebecca L. Agapov, Alexei P. Sokolov, Mark D. Foster

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

There are needs for both high resolution imaging and high sensitivity detection/analysis of surface chemistry on a nanometer scale. These needs can be addressed with Raman spectroscopy coupled with schemes that provide extraordinary enhancement of the Raman signal, namely surface enhanced (SERS) and tip enhanced Raman spectroscopy (TERS). Advances in applications of high resolution imaging and high sensitivity detection will be enabled by two specific improvements: increased signal enhancement and increased robustness of the plasmonic structures needed to achieve enhancement. Robustness and stability are especially important for those plasmonic structures made of silver that usually provide the best enhancements. Here we focus particularly on TERS, in which a plasmonic structure is placed on a scanning probe microscope tip in order to achieve high lateral resolution imaging. We have demonstrated that aluminum oxide protected silver plasmonic structures show significantly increased robustness against chemical and mechanical degradation when compared to unprotected analogues without loss of enhancement. A 2-3 nm thick coating of aluminum oxide prevents chemical attack of the underlying silver film for three months in a desiccator, significantly increasing the storage life of current probes. The same protective coating also extends the scanning life of the probe when the probe is used to image a hard patterned silicon substrate.

Original languageEnglish
Title of host publicationScanning Microscopies 2012
Subtitle of host publicationAdvanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
DOIs
StatePublished - 2012
Externally publishedYes
EventScanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Baltimore, MD, United States
Duration: Apr 24 2012Apr 26 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8378
ISSN (Print)0277-786X

Conference

ConferenceScanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Country/TerritoryUnited States
CityBaltimore, MD
Period04/24/1204/26/12

Keywords

  • chemical sensing
  • dielectric coatings
  • protected plasmonics
  • tip degradation
  • tip enhanced Raman spectroscopy

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