TY - GEN
T1 - Rise/fall time enhancement of the spallation neutron source Linac LEBT chopper system
AU - Peplov, Vladimir V.
AU - Saethre, Robert B.
PY - 2013
Y1 - 2013
N2 - The Spallation Neutron Source (SNS) Linac Low Energy Beam Transport (LEBT) chopper system provides fast chopping of the H- ion beam in the LEBT structure. Four identical pulsed power supplies (pulsers) create a series of ± 2.5 kV pulses to the four deflection electrodes floating on the focusing voltage of -50 kV. Each pulser is connected to the electrode through the network which consists of high voltage (HV) cables, a blocking capacitor, HV feed-through connectors, current-limiting resistors and transient voltage suppressors. Effective beam chopping requires minimal rise/fall time of the rectangular HV pulses on the load. In the present configuration these values are approximately 100 ns. Methods of reducing rise/fall time on the LEBT electrodes are discussed. Results of simulation and comparative measurements of the original and upgraded system on the test stand are presented. Furthermore, the effect of these changes on reliability degradation caused by arcing in the LEBT structure is discussed.
AB - The Spallation Neutron Source (SNS) Linac Low Energy Beam Transport (LEBT) chopper system provides fast chopping of the H- ion beam in the LEBT structure. Four identical pulsed power supplies (pulsers) create a series of ± 2.5 kV pulses to the four deflection electrodes floating on the focusing voltage of -50 kV. Each pulser is connected to the electrode through the network which consists of high voltage (HV) cables, a blocking capacitor, HV feed-through connectors, current-limiting resistors and transient voltage suppressors. Effective beam chopping requires minimal rise/fall time of the rectangular HV pulses on the load. In the present configuration these values are approximately 100 ns. Methods of reducing rise/fall time on the LEBT electrodes are discussed. Results of simulation and comparative measurements of the original and upgraded system on the test stand are presented. Furthermore, the effect of these changes on reliability degradation caused by arcing in the LEBT structure is discussed.
UR - http://www.scopus.com/inward/record.url?scp=84888615484&partnerID=8YFLogxK
U2 - 10.1109/PPC.2013.6627693
DO - 10.1109/PPC.2013.6627693
M3 - Conference contribution
AN - SCOPUS:84888615484
SN - 9781467351676
T3 - Digest of Technical Papers-IEEE International Pulsed Power Conference
BT - 2013 19th IEEE Pulsed Power Conference, PPC 2013
T2 - 2013 19th IEEE Pulsed Power Conference, PPC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -