Ribbon electron beam profile monitor for bunched beam tomography

Advanced beam diagnostics are essential for high performance accelerator beam production and for reliable accelerator operation. It is important to have noninvasive diagnostics which can be used continuously with intense beams of accelerated particles. Recently, an electron probe was successfully used to determine accelerated particle density distributions. However, the apparatus used for this diagnostic is large and complex which restricts its wider use for tomography of accelerated bunches. In a novel proposed device for realization of electron probe tomography a strip cathode is used for ribbon electron beam formation instead of a scanning of pencil beam used in the previous electron probe bunch profile monitors. The apparatus with the strip cathode is smaller, has simpler design and less expensive manufacturing, can have better magnetic shielding, higher sensitivity, higher resolution, can have better measurement accuracy and better time resolution. With this device it is possible to develop almost ideal tomography diagnostics of bunches in linear accelerators and in circular accelerators and storage rings.