Abstract
Rapid progress in aberration corrected electron microscopy necessitates development of robust methods for the identification of phases, ferroic variants, and other pertinent aspects of materials structure from imaging data. While unsupervised methods for clustering and classification are widely used for these tasks, their performance can be sensitive to hyperparameter selection in the analysis workflow. In this study, the effects of descriptors and hyperparameters are explored on the capability of unsupervised ML methods to distill local structural information, exemplified by the discovery of polarization and lattice distortion in Sm − dopped BiFeO3 (BFO) thin films. It is demonstrated that a reward-driven approach can be used to optimize these key hyperparameters across the full workflow, where rewards are designed to reflect domain wall continuity and straightness, ensuring that the analysis aligns with the material's physical behavior. This approach allows the discovery of local descriptors that are best aligned with the specific physical behavior, providing insight into the fundamental physics of materials. The reward driven workflow is further extended to disentangle structural factors of variation via an optimized variational autoencoder (VAE). Finally, the importance of well-defined rewards is explored as a quantifiable measure of the success of the workflow.
| Original language | English |
|---|---|
| Article number | 2418927 |
| Journal | Advanced Materials |
| Volume | 37 |
| Issue number | 35 |
| DOIs | |
| State | Published - Sep 4 2025 |
Funding
This work (workflow development, reward-driven concept) was supported (K.B., Y.L., and S.V.K.) by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences Energy Frontier Research Centers program under Award Number DE-SC0021118. STEM imaging was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS). The work at the University of Maryland was supported in part by the National Institute of Standards and Technology Cooperative Agreement 70NANB17H301 and the Center for Spintronic Materials in Advanced Information Technologies (SMART), one of the centers in nCORE, a Semiconductor Research Corporation (SRC) program sponsored by NSF and NIST. This work (workflow development, reward‐driven concept) was supported (K.B., Y.L., and S.V.K.) by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences Energy Frontier Research Centers program under Award Number DE‐SC0021118. STEM imaging was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS). The work at the University of Maryland was supported in part by the National Institute of Standards and Technology Cooperative Agreement 70NANB17H301 and the Center for Spintronic Materials in Advanced Information Technologies (SMART), one of the centers in nCORE, a Semiconductor Research Corporation (SRC) program sponsored by NSF and NIST.
Keywords
- image analysis
- machine learning
- materials science
- microscopy
- reward driven workflow