Review on Switching Device Fault, Protection, and Fault-Tolerant Topologies of Current Source Inverter

Sangwhee Lee, Feida Chen, Thomas M. Jahns, Bulent Sarlioglu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Scopus citations

Abstract

The fault modes, protection, and fault-tolerant topologies of voltage source inverters have been investigated for decades. However, issues and solutions related to the fault modes of current source inverters are less well understood. This paper summarizes some of the key topics relevant to a fault in current source inverters, including types of fault modes and their ramifications, post-fault protection methods, and fault- tolerant current source inverter topologies that have been presented in the literature.

Original languageEnglish
Title of host publication2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages489-495
Number of pages7
ISBN (Electronic)9781728192970
DOIs
StatePublished - 2021
Event13th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2021 - Dallas, United States
Duration: Aug 22 2021Aug 25 2021

Publication series

Name2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2021

Conference

Conference13th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2021
Country/TerritoryUnited States
CityDallas
Period08/22/2108/25/21

Funding

Φ This material is based on work supported by the U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under the Vehicle Technologies Office (VTO), Award Number DE-EE0008704.

Keywords

  • DC-AC power converters
  • Failure analysis
  • Fault tolerance
  • Inverters
  • Power transistors
  • Protection
  • Pulse width modulation converters
  • Semiconductor device breakdown

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