Abstract
For the development of high quantum efficiency photocathodes, the bi-alkali (K-Cs-Sb) photocathode growth process was studied through in-situ X-ray scattering measurements, including X-ray diffractometry (XRD) and X-ray reflectometry (XRR). Characterization during real-time growth revealed correlations between growth parameters and microscopic structural change of the photocathode. This paper presents preliminary results of an ongoing experiment to understand the growth mechanism. X-ray diffractometry enabled the observation of selective growth of specific crystalline orientation during the deposition and evaporation of an Sb layer. A phase transition of the Sb layer was also measured. X-ray reflectometry revealed surface roughness changes during the growth process and permitted layer thickness measurements while the K layer was evaporated on an ex-situ grown Sb layer, in addition to in-situ Sb layer growth.
| Original language | English |
|---|---|
| Pages (from-to) | 765-772 |
| Number of pages | 8 |
| Journal | Physics Procedia |
| Volume | 37 |
| DOIs | |
| State | Published - 2012 |
| Externally published | Yes |
| Event | 2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, United States Duration: Jun 9 2011 → Jun 14 2011 |
Funding
The submitted manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (“Argonne”). Argonne, a U.S. Department of Energy Office of Science laboratory, is operated under Contract No. DE-AC02-06CH11357. The U.S. Government retains for itself, and others acting on its behalf, a paid-up nonexclusive, irrevocable worldwide license in said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government.
Keywords
- Multi-alkali photocathode
- X-ray diffractometry
- X-ray reflectometry
- thin film growth