Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics

A. J. Breen; A. C. Day; B. Lim; W. J. Davids; S. P. Ringer

doi:10.1016/j.ultramic.2022.113640

Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics

A. J. Breen, A. C. Day, B. Lim, W. J. Davids, S. P. Ringer

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Poles and zone lines observed within atom probe field evaporation images are useful for a range of atom probe crystallography studies, including calibration of the reconstruction and crystallographic characterisation of microstructural features such as grain boundaries. However, this information is not always readily apparent. Techniques for plotting crystallographically correlated metrics contained within atom probe data to enhance pole and zone line contrast across the detector space are developed. This includes consideration of the electric field, molecular ions, lattice structure retained within the reconstruction, specific elemental species, the number of pulses between detection events, and the lateral distance between sequential detection events. These approaches are then applied to experimental atom probe tomography datasets on technically pure Al, nanocrystalline Al, highly doped Si, and additively manufactured Inconel 738, Haynes 282, and Ti–6Al–4V. The results facilitate the extension of atom probe crystallography studies to a broader range of crystalline datasets where crystallographic information is not readily apparent from existing methods, as well as a deeper understanding of field evaporation behaviour during an atom probe experiment.

Original language	English
Article number	113640
Journal	Ultramicroscopy
Volume	243
DOIs	https://doi.org/10.1016/j.ultramic.2022.113640
State	Published - Jan 2023
Externally published	Yes

Funding

The authors acknowledge the facilities and technical assistance of colleagues from Sydney Microscopy and Microanalysis (SMM) and the Sydney Informatics Hub (SIH), which are core research facilities at the University of Sydney. SMM is the University of Sydney's node of Microscopy Australia — a national research facility. The authors acknowledge Dr Takanori Sato, Dr Gordon McDonald and Jim Matthews for technical support. The authors acknowledge fruitful discussions with Dr Anna Ceguerra, Dr Nathan Wallace, Mr. James Dingle, Dr. Evangelia Lampiri and Dr Baptiste Gault. Legacy MATLAB® code from Dr Baptiste Gault and Dr Peter Felfer was used in the analysis of this work. Dr Katja Eder is thanked for her help with acquiring the nanocrystalline Al dataset as set out in detail in [6] . This work was partly sponsored by the Department of Industry, Innovation and Science under the auspices of the AUSMURI program. Prof. Simon P. Ringer acknowledges partial funding from the Australian Research Council (DP200100940). The facilities and technical assistance of the teams at Oak-Ridge National Laboratory (ORNL) are acknowledged for the fabrication of the additively manufactured Inconel 738, Haynes 282, and Ti-6Al-4V builds. The research at Oak-Ridge National Laboratory was sponsored by the US Department of Energy, Office of Energy Efficiency and Renewable Energy, Advanced Manufacturing Office under contract DE-AC05-00OR22725 with UT-Battelle, LLC. Access to the ORNL's additive manufacturing equipment at ORNL’s Manufacturing Demonstration Facility (MDF) was facilitated by US Department of Energy’s Strategic Partnership Projects (SPP) mechanism. The authors acknowledge the facilities and technical assistance of colleagues from Sydney Microscopy and Microanalysis (SMM) and the Sydney Informatics Hub (SIH), which are core research facilities at the University of Sydney. SMM is the University of Sydney's node of Microscopy Australia — a national research facility. The authors acknowledge Dr Takanori Sato, Dr Gordon McDonald and Jim Matthews for technical support. The authors acknowledge fruitful discussions with Dr Anna Ceguerra, Dr Nathan Wallace, Mr. James Dingle, Dr. Evangelia Lampiri and Dr Baptiste Gault. Legacy MATLAB® code from Dr Baptiste Gault and Dr Peter Felfer was used in the analysis of this work. Dr Katja Eder is thanked for her help with acquiring the nanocrystalline Al dataset as set out in detail in [6]. This work was partly sponsored by the Department of Industry, Innovation and Science under the auspices of the AUSMURI program. Prof. Simon P. Ringer acknowledges partial funding from the Australian Research Council (DP200100940). The facilities and technical assistance of the teams at Oak-Ridge National Laboratory (ORNL) are acknowledged for the fabrication of the additively manufactured Inconel 738, Haynes 282, and Ti-6Al-4V builds. The research at Oak-Ridge National Laboratory was sponsored by the US Department of Energy, Office of Energy Efficiency and Renewable Energy, Advanced Manufacturing Office under contract DE-AC05-00OR22725 with UT-Battelle, LLC. Access to the ORNL's additive manufacturing equipment at ORNL's Manufacturing Demonstration Facility (MDF) was facilitated by US Department of Energy's Strategic Partnership Projects (SPP) mechanism.

Funders	Funder number
Sydney Informatics Hub
U.S. Department of Energy
Advanced Manufacturing Office	DE-AC05-00OR22725
Office of Energy Efficiency and Renewable Energy
Oak Ridge National Laboratory
Australian Research Council	DP200100940
University of Sydney
Department of Industry, Innovation and Science, Australian Government

Keywords

Atom probe crystallography
Data mining
Field evaporation
Image processing

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10.1016/j.ultramic.2022.113640

Cite this

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title = "Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics",

abstract = "Poles and zone lines observed within atom probe field evaporation images are useful for a range of atom probe crystallography studies, including calibration of the reconstruction and crystallographic characterisation of microstructural features such as grain boundaries. However, this information is not always readily apparent. Techniques for plotting crystallographically correlated metrics contained within atom probe data to enhance pole and zone line contrast across the detector space are developed. This includes consideration of the electric field, molecular ions, lattice structure retained within the reconstruction, specific elemental species, the number of pulses between detection events, and the lateral distance between sequential detection events. These approaches are then applied to experimental atom probe tomography datasets on technically pure Al, nanocrystalline Al, highly doped Si, and additively manufactured Inconel 738, Haynes 282, and Ti–6Al–4V. The results facilitate the extension of atom probe crystallography studies to a broader range of crystalline datasets where crystallographic information is not readily apparent from existing methods, as well as a deeper understanding of field evaporation behaviour during an atom probe experiment.",

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AU - Day, A. C.

AU - Lim, B.

AU - Davids, W. J.

AU - Ringer, S. P.

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N2 - Poles and zone lines observed within atom probe field evaporation images are useful for a range of atom probe crystallography studies, including calibration of the reconstruction and crystallographic characterisation of microstructural features such as grain boundaries. However, this information is not always readily apparent. Techniques for plotting crystallographically correlated metrics contained within atom probe data to enhance pole and zone line contrast across the detector space are developed. This includes consideration of the electric field, molecular ions, lattice structure retained within the reconstruction, specific elemental species, the number of pulses between detection events, and the lateral distance between sequential detection events. These approaches are then applied to experimental atom probe tomography datasets on technically pure Al, nanocrystalline Al, highly doped Si, and additively manufactured Inconel 738, Haynes 282, and Ti–6Al–4V. The results facilitate the extension of atom probe crystallography studies to a broader range of crystalline datasets where crystallographic information is not readily apparent from existing methods, as well as a deeper understanding of field evaporation behaviour during an atom probe experiment.

AB - Poles and zone lines observed within atom probe field evaporation images are useful for a range of atom probe crystallography studies, including calibration of the reconstruction and crystallographic characterisation of microstructural features such as grain boundaries. However, this information is not always readily apparent. Techniques for plotting crystallographically correlated metrics contained within atom probe data to enhance pole and zone line contrast across the detector space are developed. This includes consideration of the electric field, molecular ions, lattice structure retained within the reconstruction, specific elemental species, the number of pulses between detection events, and the lateral distance between sequential detection events. These approaches are then applied to experimental atom probe tomography datasets on technically pure Al, nanocrystalline Al, highly doped Si, and additively manufactured Inconel 738, Haynes 282, and Ti–6Al–4V. The results facilitate the extension of atom probe crystallography studies to a broader range of crystalline datasets where crystallographic information is not readily apparent from existing methods, as well as a deeper understanding of field evaporation behaviour during an atom probe experiment.

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Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics

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Keywords

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