Revealing Laser Interactions with Thin Films Using In Situ Methods

Kinga A. Unocic, John Lasseter, Yousub Lee, Rangasayee Kannan, Spencer Gellerup, Stephen Jesse, Philip D. Rack, Kevin Roccapriore, Harry Meyer, Steven Randolph

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)1416-1417
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

This research is sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the US Department of Energy. Microscopy was performed as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility.

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