Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

C. Schüßler-Langeheine, E. Weschke, A. Yu Grigoriev, H. Ott, R. Meier, D. V. Vyalikh, Chandan Mazumdar, C. Sutter, D. Abernathy, G. Grübel, G. Kaindl

Research output: Contribution to journalConference articlepeer-review

27 Scopus citations

Abstract

The magnetic structure of ultrathin Ho-metal films grown on W(110) was studied by resonant magnetic X-ray scattering at the L3 and M5 resonances. For Ho films down to 14 monolayer (ML) thickness, a bulk-like helical antiferromagnetic structure is observed. For a 10-ML thick film, an altered magnetic structure and enhanced layer spacing is found.

Original languageEnglish
Pages (from-to)953-957
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume114-116
DOIs
StatePublished - Mar 2001
Externally publishedYes
Event8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
Duration: Aug 8 2000Aug 12 2000

Funding

The authors are indebted to the staff of BESSY II and of the W1.1 beamline at HASYLAB for their cooperation in the preparation and the performance of the experiments. We thank G. Helgesen for providing the original data from Ref. [5] . This work was supported by the BMBF, project 05 SF8 KEC8, the DFG, Sfb290/TP A06, and the European Union (EFRE). CM acknowledges support form the Alexander von Humboldt foundation.

Fingerprint

Dive into the research topics of 'Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers'. Together they form a unique fingerprint.

Cite this