Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

M. L. Crow; G. Schupp; W. B. Yelon; J. G. Mullen; A. Djedid

doi:10.1107/S0108767387098799

Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

M. L. Crow
, G. Schupp
, W. B. Yelon
, J. G. Mullen
, A. Djedid

Neutron Optics & Polarization

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English
Pages (from-to)	638-645
Number of pages	8
Journal	Acta Crystallographica Section A
Volume	43
Issue number	5
DOIs	https://doi.org/10.1107/S0108767387098799
State	Published - Sep 1987

Access to Document

10.1107/S0108767387098799

Cite this

@article{6f247bd404fb49b6bddfe5226f1e0743,

title = "Resolution analyses for M{\"o}ssbauer diffraction: resolved TDS profiles in silicon",

author = "Crow, \{M. L.\} and G. Schupp and Yelon, \{W. B.\} and Mullen, \{J. G.\} and A. Djedid",

year = "1987",

month = sep,

doi = "10.1107/S0108767387098799",

language = "English",

volume = "43",

pages = "638--645",

journal = "Acta Crystallographica Section A",

issn = "0108-7673",

number = "5",

}

TY - JOUR

T1 - Resolution analyses for Mössbauer diffraction

T2 - resolved TDS profiles in silicon

AU - Crow, M. L.

AU - Schupp, G.

AU - Yelon, W. B.

AU - Mullen, J. G.

AU - Djedid, A.

PY - 1987/9

Y1 - 1987/9

UR - https://www.scopus.com/pages/publications/84926832281

U2 - 10.1107/S0108767387098799

DO - 10.1107/S0108767387098799

M3 - Article

AN - SCOPUS:84926832281

SN - 0108-7673

VL - 43

SP - 638

EP - 645

JO - Acta Crystallographica Section A

JF - Acta Crystallographica Section A

IS - 5

ER -

Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

Access to Document

Other files and links

Cite this