Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

M. L. Crow; G. Schupp; W. B. Yelon; J. G. Mullen; A. Djedid

doi:10.1107/S0108767387098799

Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

M. L. Crow, G. Schupp, W. B. Yelon, J. G. Mullen, A. Djedid

Neutron Optics & Polarization

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English
Pages (from-to)	638-645
Number of pages	8
Journal	Acta Crystallographica Section A
Volume	43
Issue number	5
DOIs	https://doi.org/10.1107/S0108767387098799
State	Published - Sep 1987

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title = "Resolution analyses for M{\"o}ssbauer diffraction: resolved TDS profiles in silicon",

author = "Crow, {M. L.} and G. Schupp and Yelon, {W. B.} and Mullen, {J. G.} and A. Djedid",

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AU - Crow, M. L.

AU - Schupp, G.

AU - Yelon, W. B.

AU - Mullen, J. G.

AU - Djedid, A.

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JF - Acta Crystallographica Section A

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Resolution analyses for Mössbauer diffraction: resolved TDS profiles in silicon

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