Resistance degradation behavior of Ba0.7Sr0.3TiO3 thin films compared to mechanisms found in titanate ceramics and single crystals

M. Grossmann; S. Hoffmann; S. Gusowski; R. Waser; S. K. Streiffer; C. Basceri; C. B. Parker; S. E. Lash; A. I. Kingon

doi:10.1080/10584589808208032

Resistance degradation behavior of Ba_0.7Sr_0.3TiO₃ thin films compared to mechanisms found in titanate ceramics and single crystals

M. Grossmann, S. Hoffmann, S. Gusowski, R. Waser, S. K. Streiffer, C. Basceri, C. B. Parker, S. E. Lash, A. I. Kingon

Oak Ridge National Laboratory

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

The resistance degradation behavior of Ba_0.7Sr_0.3TiO₃ (BST) and SrTiO₃ (ST) thin films is compared to the degradation behavior of titanate single crystals and ceramics with respect to the dependence on parameters such as temperature, thickness of the sample, applied voltage, acceptor dopant concentration and electrode material. Different model considerations to explain the resistance degradation in titanate thin films are discussed.

Original language	English
Pages (from-to)	83-94
Number of pages	12
Journal	Integrated Ferroelectrics
Volume	22
Issue number	1-4
DOIs	https://doi.org/10.1080/10584589808208032
State	Published - 1998

Keywords

BST
Resistance degradation
Thin film

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10.1080/10584589808208032

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title = "Resistance degradation behavior of Ba0.7Sr0.3TiO3 thin films compared to mechanisms found in titanate ceramics and single crystals",

abstract = "The resistance degradation behavior of Ba0.7Sr0.3TiO3 (BST) and SrTiO3 (ST) thin films is compared to the degradation behavior of titanate single crystals and ceramics with respect to the dependence on parameters such as temperature, thickness of the sample, applied voltage, acceptor dopant concentration and electrode material. Different model considerations to explain the resistance degradation in titanate thin films are discussed.",

keywords = "BST, Resistance degradation, Thin film",

author = "M. Grossmann and S. Hoffmann and S. Gusowski and R. Waser and Streiffer, {S. K.} and C. Basceri and Parker, {C. B.} and Lash, {S. E.} and Kingon, {A. I.}",

year = "1998",

doi = "10.1080/10584589808208032",

language = "English",

volume = "22",

pages = "83--94",

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TY - JOUR

T1 - Resistance degradation behavior of Ba0.7Sr0.3TiO3 thin films compared to mechanisms found in titanate ceramics and single crystals

AU - Grossmann, M.

AU - Hoffmann, S.

AU - Gusowski, S.

AU - Waser, R.

AU - Streiffer, S. K.

AU - Basceri, C.

AU - Parker, C. B.

AU - Lash, S. E.

AU - Kingon, A. I.

PY - 1998

Y1 - 1998

N2 - The resistance degradation behavior of Ba0.7Sr0.3TiO3 (BST) and SrTiO3 (ST) thin films is compared to the degradation behavior of titanate single crystals and ceramics with respect to the dependence on parameters such as temperature, thickness of the sample, applied voltage, acceptor dopant concentration and electrode material. Different model considerations to explain the resistance degradation in titanate thin films are discussed.

AB - The resistance degradation behavior of Ba0.7Sr0.3TiO3 (BST) and SrTiO3 (ST) thin films is compared to the degradation behavior of titanate single crystals and ceramics with respect to the dependence on parameters such as temperature, thickness of the sample, applied voltage, acceptor dopant concentration and electrode material. Different model considerations to explain the resistance degradation in titanate thin films are discussed.

KW - BST

KW - Resistance degradation

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=0032316435&partnerID=8YFLogxK

U2 - 10.1080/10584589808208032

DO - 10.1080/10584589808208032

M3 - Article

AN - SCOPUS:0032316435

SN - 1058-4587

VL - 22

SP - 83

EP - 94

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1-4

ER -

Resistance degradation behavior of Ba_0.7Sr_0.3TiO₃ thin films compared to mechanisms found in titanate ceramics and single crystals

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Keywords

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