TY - GEN
T1 - Residual gas effect in LEBT on transverse emittance of multiply charged heavy ion beams extracted from ECR ion source
AU - Nagatomo, T.
AU - Tzoganis, V.
AU - Mira, J. P.
AU - Nakagawa, T.
AU - Kamigaito, O.
N1 - Publisher Copyright:
© 2018 Author(s).
PY - 2018/9/21
Y1 - 2018/9/21
N2 - By utilizing a pepper-pot emittance meter, we have measured the four-dimensional transverse phase-space distribution for multiply charged argon ions generated by an 18-GHz superconducting electron cyclotron resonance ion source (18-GHz SC-ECRIS) at RIKEN for gas pressures of 10-5 to 10-3 Pa during low-energy beam transport (LEBT), in order to reveal the effects of residual gas. An advantage of the presence of residual gas is neutralization and moderation of the space-charge effect of the beam. At the beam-extraction point of the SC-ECRIS, a few milliamps ion beam produces a non-negligible space-charge effect, which is expected to influence the emittance, and to depend on the LEBT pressure. To evaluate the effects of charge exchange, natural argon or hydrogen gas was injected into an LEBT system through a variable leak valve to control the amount of residual gas. In the case of argon gas injection, the charge exchange between the argon beam and the injected argon gas clearly increased when the LEBT pressure exceeded 10-4 Pa. By analyzing the four-dimensional phase-space distribution, charge-exchange components with a Bρ difference of less than 1%, which were totally inseparable using the analyzing magnet, were quantitatively estimated. After the elimination of the charge-exchange components, no significant change in the beam current or the transverse emittance was observed in the present study. Similar results were obtained for hydrogen gas injection. However, in this case, an increase was observed in the intensity of Ar-ion beams with lower charge states of 7+ and 8+, as well as multiply charged N- and O-ion beams. The injected hydrogen seemed to play a role as a "support gas", causing mixing in the ECR plasma.
AB - By utilizing a pepper-pot emittance meter, we have measured the four-dimensional transverse phase-space distribution for multiply charged argon ions generated by an 18-GHz superconducting electron cyclotron resonance ion source (18-GHz SC-ECRIS) at RIKEN for gas pressures of 10-5 to 10-3 Pa during low-energy beam transport (LEBT), in order to reveal the effects of residual gas. An advantage of the presence of residual gas is neutralization and moderation of the space-charge effect of the beam. At the beam-extraction point of the SC-ECRIS, a few milliamps ion beam produces a non-negligible space-charge effect, which is expected to influence the emittance, and to depend on the LEBT pressure. To evaluate the effects of charge exchange, natural argon or hydrogen gas was injected into an LEBT system through a variable leak valve to control the amount of residual gas. In the case of argon gas injection, the charge exchange between the argon beam and the injected argon gas clearly increased when the LEBT pressure exceeded 10-4 Pa. By analyzing the four-dimensional phase-space distribution, charge-exchange components with a Bρ difference of less than 1%, which were totally inseparable using the analyzing magnet, were quantitatively estimated. After the elimination of the charge-exchange components, no significant change in the beam current or the transverse emittance was observed in the present study. Similar results were obtained for hydrogen gas injection. However, in this case, an increase was observed in the intensity of Ar-ion beams with lower charge states of 7+ and 8+, as well as multiply charged N- and O-ion beams. The injected hydrogen seemed to play a role as a "support gas", causing mixing in the ECR plasma.
UR - http://www.scopus.com/inward/record.url?scp=85054187426&partnerID=8YFLogxK
U2 - 10.1063/1.5053359
DO - 10.1063/1.5053359
M3 - Conference contribution
AN - SCOPUS:85054187426
SN - 9780735417274
T3 - AIP Conference Proceedings
BT - Proceedings of the 17th International Conference on Ion Sources
A2 - Mahner, Edgar
A2 - Scrivens, Richard
A2 - Pardo, Richard
A2 - Lettry, Jacques
A2 - Marsh, Bruce
PB - American Institute of Physics Inc.
T2 - 17th International Conference on Ion Sources 2018
Y2 - 15 September 2017 through 20 September 2017
ER -