Relaxor ferroelectricity in strained epitaxial SrTiO 3 thin films on DyScO 3 substrates

M. D. Biegalski; Y. Jia; D. G. Schlom; S. Trolier-Mckinstry; S. K. Streiffer; V. Sherman; R. Uecker; P. Reiche

doi:10.1063/1.2198088

Relaxor ferroelectricity in strained epitaxial SrTiO ₃ thin films on DyScO ₃ substrates

M. D. Biegalski, Y. Jia, D. G. Schlom, S. Trolier-Mckinstry, S. K. Streiffer, V. Sherman, R. Uecker, P. Reiche

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Abstract

The ferroelectric properties of 500 Å thick strained, epitaxial SrTi O3 films grown on DySc O3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

Original language	English
Article number	192907
Journal	Applied Physics Letters
Volume	88
Issue number	19
DOIs	https://doi.org/10.1063/1.2198088
State	Published - 2006
Externally published	Yes

Funding

The authors gratefully acknowledge discussions with G. A. Samara and the financial support of the National Science Foundation through Grant No. DMR-0507146 and, for the work performed at ANL, the U.S. Department of Energy, Basic Energy Sciences-Materials Sciences, through Contract No. W-31-109-ENG-38.

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title = "Relaxor ferroelectricity in strained epitaxial SrTiO 3 thin films on DyScO 3 substrates",

abstract = "The ferroelectric properties of 500 {\AA} thick strained, epitaxial SrTi O3 films grown on DySc O3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.",

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AU - Biegalski, M. D.

AU - Jia, Y.

AU - Schlom, D. G.

AU - Trolier-Mckinstry, S.

AU - Streiffer, S. K.

AU - Sherman, V.

AU - Uecker, R.

AU - Reiche, P.

PY - 2006

Y1 - 2006

N2 - The ferroelectric properties of 500 Å thick strained, epitaxial SrTi O3 films grown on DySc O3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

AB - The ferroelectric properties of 500 Å thick strained, epitaxial SrTi O3 films grown on DySc O3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

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Relaxor ferroelectricity in strained epitaxial SrTiO ₃ thin films on DyScO ₃ substrates

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