Refractive index of sodium iodide

G. E. Jellison; L. A. Boatner; J. O. Ramey; J. A. Kolopus; L. A. Ramey; D. J. Singh

doi:10.1063/1.3689746

Refractive index of sodium iodide

G. E. Jellison, L. A. Boatner, J. O. Ramey, J. A. Kolopus, L. A. Ramey, D. J. Singh

Correlated Electron Materials

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Abstract

The refractive index of sodium iodide, an important scintillator material that is widely used for radiation detection, is based on a single measurement made by Spangenberg at one wavelength using the index-matching liquid immersion method (Z. Kristallogr. 57, 494 (1923)). In the present paper, we present new results for the refractive index of sodium iodide as measured by the minimum deviation technique at six wavelengths between 436 nm (n = 1.839 ± 0.002) and 633 nm (n = 1.786 ± 0.002). These six measurements can be fit to a Sellmeier model, resulting in a ² of 1.02, indicating a good fit to the data. In addition, we report on ellipsometry measurements, which suggest that the near-surface region of the air sensitive NaI crystal seriously degrades, even in a moisture-free environment, resulting in a significantly lower value of the refractive index near the surface. First-principles theoretical calculations of the NaI refractive index that agree with the measured values within 0.025-0.045 are also presented and discussed.

Original language	English
Article number	043521
Journal	Journal of Applied Physics
Volume	111
Issue number	4
DOIs	https://doi.org/10.1063/1.3689746
State	Published - Feb 15 2012

Funding

This research has been supported by NA-22/NNSA program of the Department of Energy. Research at the Oak Ridge National Laboratory for the authors L.A.B., J.O.R., J.A.K., and L.A.R. was sponsored in part by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division. Oak Ridge National Laboratory is managed by UT-Battelle, LLC for the U. S. Department of Energy.

Funders	Funder number
U.S. Department of Energy
Basic Energy Sciences
Division of Materials Sciences and Engineering

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title = "Refractive index of sodium iodide",

abstract = "The refractive index of sodium iodide, an important scintillator material that is widely used for radiation detection, is based on a single measurement made by Spangenberg at one wavelength using the index-matching liquid immersion method (Z. Kristallogr. 57, 494 (1923)). In the present paper, we present new results for the refractive index of sodium iodide as measured by the minimum deviation technique at six wavelengths between 436 nm (n = 1.839 ± 0.002) and 633 nm (n = 1.786 ± 0.002). These six measurements can be fit to a Sellmeier model, resulting in a 2 of 1.02, indicating a good fit to the data. In addition, we report on ellipsometry measurements, which suggest that the near-surface region of the air sensitive NaI crystal seriously degrades, even in a moisture-free environment, resulting in a significantly lower value of the refractive index near the surface. First-principles theoretical calculations of the NaI refractive index that agree with the measured values within 0.025-0.045 are also presented and discussed.",

author = "Jellison, {G. E.} and Boatner, {L. A.} and Ramey, {J. O.} and Kolopus, {J. A.} and Ramey, {L. A.} and Singh, {D. J.}",

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AU - Jellison, G. E.

AU - Boatner, L. A.

AU - Ramey, J. O.

AU - Kolopus, J. A.

AU - Ramey, L. A.

AU - Singh, D. J.

PY - 2012/2/15

Y1 - 2012/2/15

N2 - The refractive index of sodium iodide, an important scintillator material that is widely used for radiation detection, is based on a single measurement made by Spangenberg at one wavelength using the index-matching liquid immersion method (Z. Kristallogr. 57, 494 (1923)). In the present paper, we present new results for the refractive index of sodium iodide as measured by the minimum deviation technique at six wavelengths between 436 nm (n = 1.839 ± 0.002) and 633 nm (n = 1.786 ± 0.002). These six measurements can be fit to a Sellmeier model, resulting in a 2 of 1.02, indicating a good fit to the data. In addition, we report on ellipsometry measurements, which suggest that the near-surface region of the air sensitive NaI crystal seriously degrades, even in a moisture-free environment, resulting in a significantly lower value of the refractive index near the surface. First-principles theoretical calculations of the NaI refractive index that agree with the measured values within 0.025-0.045 are also presented and discussed.

AB - The refractive index of sodium iodide, an important scintillator material that is widely used for radiation detection, is based on a single measurement made by Spangenberg at one wavelength using the index-matching liquid immersion method (Z. Kristallogr. 57, 494 (1923)). In the present paper, we present new results for the refractive index of sodium iodide as measured by the minimum deviation technique at six wavelengths between 436 nm (n = 1.839 ± 0.002) and 633 nm (n = 1.786 ± 0.002). These six measurements can be fit to a Sellmeier model, resulting in a 2 of 1.02, indicating a good fit to the data. In addition, we report on ellipsometry measurements, which suggest that the near-surface region of the air sensitive NaI crystal seriously degrades, even in a moisture-free environment, resulting in a significantly lower value of the refractive index near the surface. First-principles theoretical calculations of the NaI refractive index that agree with the measured values within 0.025-0.045 are also presented and discussed.

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Refractive index of sodium iodide

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