Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation

X. Cui; F. A. List; D. M. Kroeger; A. Goyal; D. F. Lee; J. Mathis; E. D. Specht; P. M. Martin; R. Feenstra; D. T. Verebelyi; D. K. Christen

doi:10.1109/77.784847

Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation

X. Cui, F. A. List, D. M. Kroeger, A. Goyal, D. F. Lee, J. Mathis, E. D. Specht, P. M. Martin, R. Feenstra, D. T. Verebelyi, D. K. Christen

Deposition Science and Technology

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9 Scopus citations

Abstract

A reel-to-reel, electron beam evaporation system has been developed to continuously deposit epitaxial CeO2 and other oxide buffer layers on meter-long lengths of biaxially textured Ni tapes. The deposition system includes two interconnected electron beam evaporation chambers and a chamber in which as-rolled Ni tape is in situ annealed to develop biaxial texture. An integral reel-to-reel system with tension control enables motion of the tape with little or no plastic deformation. When depositing epitaxial oxides on Ni, the formation of unfavorably oriented NiO is difficult to avoid. Oxide free, {100}<100> oriented Ni tapes are prepared by control of the partial pressures of H2, HZO and O2 during Ni annealing. X-ray iji-scans have been performed as a function of length to determine the crystallographic consistency of the epitaxial CeO2 over length. Results of SEM examinations of the CeO2 buffer layer microstructure are presented. Results for YBCO films deposited on short segments of these buffered substrates are summarized.

Original language	English
Pages (from-to)	1967-1970
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	9
Issue number	2 PART 2
DOIs	https://doi.org/10.1109/77.784847
State	Published - 1999

Funding

Manuscript received September 14,1998. This work was conducted in part under a CRADA with 3WSouthwireLANL funded by the US Department of Energy, the Office of Energy Efficiency and Renewable Energy, and the Office of Energy Research. Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research Corporation for the US Department of Energy under contract # DE-AC05-960R22464. The authors would like to thank R. A. Hawsey for his support. Three of us (X. Cui., J. E. Mathis. and D. T. Verebelyi.) would like to acknowledge the support from Oak Ridge Associated Universities.

Funders	Funder number
Lockheed Martin Energy Research Corporation	DE-AC05-960R22464
Office of Energy Research
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge Associated Universities

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Cui, X., List, F. A., Kroeger, D. M., Goyal, A., Lee, D. F., Mathis, J., Specht, E. D., Martin, P. M., Feenstra, R., Verebelyi, D. T., & Christen, D. K. (1999). Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation. IEEE Transactions on Applied Superconductivity, 9(2 PART 2), 1967-1970. https://doi.org/10.1109/77.784847

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title = "Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation",

abstract = "A reel-to-reel, electron beam evaporation system has been developed to continuously deposit epitaxial CeO2 and other oxide buffer layers on meter-long lengths of biaxially textured Ni tapes. The deposition system includes two interconnected electron beam evaporation chambers and a chamber in which as-rolled Ni tape is in situ annealed to develop biaxial texture. An integral reel-to-reel system with tension control enables motion of the tape with little or no plastic deformation. When depositing epitaxial oxides on Ni, the formation of unfavorably oriented NiO is difficult to avoid. Oxide free, {100}<100> oriented Ni tapes are prepared by control of the partial pressures of H2, HZO and O2 during Ni annealing. X-ray iji-scans have been performed as a function of length to determine the crystallographic consistency of the epitaxial CeO2 over length. Results of SEM examinations of the CeO2 buffer layer microstructure are presented. Results for YBCO films deposited on short segments of these buffered substrates are summarized.",

author = "X. Cui and List, {F. A.} and Kroeger, {D. M.} and A. Goyal and Lee, {D. F.} and J. Mathis and Specht, {E. D.} and Martin, {P. M.} and R. Feenstra and Verebelyi, {D. T.} and Christen, {D. K.}",

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Cui, X, List, FA, Kroeger, DM, Goyal, A, Lee, DF, Mathis, J, Specht, ED, Martin, PM, Feenstra, R, Verebelyi, DT & Christen, DK 1999, 'Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation', IEEE Transactions on Applied Superconductivity, vol. 9, no. 2 PART 2, pp. 1967-1970. https://doi.org/10.1109/77.784847

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AU - Cui, X.

AU - List, F. A.

AU - Kroeger, D. M.

AU - Goyal, A.

AU - Lee, D. F.

AU - Mathis, J.

AU - Specht, E. D.

AU - Martin, P. M.

AU - Feenstra, R.

AU - Verebelyi, D. T.

AU - Christen, D. K.

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Y1 - 1999

N2 - A reel-to-reel, electron beam evaporation system has been developed to continuously deposit epitaxial CeO2 and other oxide buffer layers on meter-long lengths of biaxially textured Ni tapes. The deposition system includes two interconnected electron beam evaporation chambers and a chamber in which as-rolled Ni tape is in situ annealed to develop biaxial texture. An integral reel-to-reel system with tension control enables motion of the tape with little or no plastic deformation. When depositing epitaxial oxides on Ni, the formation of unfavorably oriented NiO is difficult to avoid. Oxide free, {100}<100> oriented Ni tapes are prepared by control of the partial pressures of H2, HZO and O2 during Ni annealing. X-ray iji-scans have been performed as a function of length to determine the crystallographic consistency of the epitaxial CeO2 over length. Results of SEM examinations of the CeO2 buffer layer microstructure are presented. Results for YBCO films deposited on short segments of these buffered substrates are summarized.

AB - A reel-to-reel, electron beam evaporation system has been developed to continuously deposit epitaxial CeO2 and other oxide buffer layers on meter-long lengths of biaxially textured Ni tapes. The deposition system includes two interconnected electron beam evaporation chambers and a chamber in which as-rolled Ni tape is in situ annealed to develop biaxial texture. An integral reel-to-reel system with tension control enables motion of the tape with little or no plastic deformation. When depositing epitaxial oxides on Ni, the formation of unfavorably oriented NiO is difficult to avoid. Oxide free, {100}<100> oriented Ni tapes are prepared by control of the partial pressures of H2, HZO and O2 during Ni annealing. X-ray iji-scans have been performed as a function of length to determine the crystallographic consistency of the epitaxial CeO2 over length. Results of SEM examinations of the CeO2 buffer layer microstructure are presented. Results for YBCO films deposited on short segments of these buffered substrates are summarized.

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Reel-to-reel continuous deposition of epitaxial ceo2 buffer layers on biaxially textured ni tapes by electron beam evaporation

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