Reduction of defect fluxes using dual-ion-beam processing

A. Iwase; L. E. Rehn; P. M. Baldo; P. R. Okamoto; H. Wiedersich; L. Funk

Reduction of defect fluxes using dual-ion-beam processing

A. Iwase
, L. E. Rehn
, P. M. Baldo
, P. R. Okamoto
, H. Wiedersich
, L. Funk

Detectors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Radiation-induced segregation (RIS) in Ni-12.7% Si and Cu-1% Au alloys was studied using Rutherford backscattering spectroscopy during He and Ne irradiation at elevated temperatures. During single ion-beam irradiation with 1.5 MeV He, strong RIS of Si toward the surface was observed in Ni-12.7% Si. Simultaneous irradiation with 400 keV Ne and 1.5 MeV He almost completely suppressed the Si segregation, even when the calculated damage production rate by Ne was only a few percent of that by He ions. A similar effect of dual-beam irradiation was observed in the Cu-1% Au alloy, i.e., the rate of near surface Au depletion was strongly reduced under simultaneous irradiation. The present result shows that dual-beam irradiation can be applied to control RIS and RED (Radiation Enhanced Diffusion) during ion beam processing.

Original language	English
Title of host publication	Materials Synthesis and Processing Using Ion Beams
Editors	Anthony F. Garito, Alex K-Y. Jen, Charles Y-C. Lee, Larry R. Dalton
Publisher	Publ by Materials Research Society
Pages	57-62
Number of pages	6
ISBN (Print)	1558992154
State	Published - 1994
Event	Proceedings of the MRS 1993 Fall Meeting - Boston, MA, USA Duration: Nov 29 1993 → Dec 3 1993

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	316
ISSN (Print)	0272-9172

Conference

Conference	Proceedings of the MRS 1993 Fall Meeting
City	Boston, MA, USA
Period	11/29/93 → 12/3/93

Cite this

Iwase, A., Rehn, L. E., Baldo, P. M., Okamoto, P. R., Wiedersich, H., & Funk, L. (1994). Reduction of defect fluxes using dual-ion-beam processing. In A. F. Garito, A. K.-Y. Jen, C. Y.-C. Lee, & L. R. Dalton (Eds.), Materials Synthesis and Processing Using Ion Beams (pp. 57-62). (Materials Research Society Symposium Proceedings; Vol. 316). Publ by Materials Research Society.

@inproceedings{fdb357f8fb974d4597136f4ca3625f4f,

title = "Reduction of defect fluxes using dual-ion-beam processing",

abstract = "Radiation-induced segregation (RIS) in Ni-12.7\% Si and Cu-1\% Au alloys was studied using Rutherford backscattering spectroscopy during He and Ne irradiation at elevated temperatures. During single ion-beam irradiation with 1.5 MeV He, strong RIS of Si toward the surface was observed in Ni-12.7\% Si. Simultaneous irradiation with 400 keV Ne and 1.5 MeV He almost completely suppressed the Si segregation, even when the calculated damage production rate by Ne was only a few percent of that by He ions. A similar effect of dual-beam irradiation was observed in the Cu-1\% Au alloy, i.e., the rate of near surface Au depletion was strongly reduced under simultaneous irradiation. The present result shows that dual-beam irradiation can be applied to control RIS and RED (Radiation Enhanced Diffusion) during ion beam processing.",

author = "A. Iwase and Rehn, \{L. E.\} and Baldo, \{P. M.\} and Okamoto, \{P. R.\} and H. Wiedersich and L. Funk",

year = "1994",

language = "English",

isbn = "1558992154",

series = "Materials Research Society Symposium Proceedings",

publisher = "Publ by Materials Research Society",

pages = "57--62",

editor = "Garito, \{Anthony F.\} and Jen, \{Alex K-Y.\} and Lee, \{Charles Y-C.\} and Dalton, \{Larry R.\}",

booktitle = "Materials Synthesis and Processing Using Ion Beams",

note = "Proceedings of the MRS 1993 Fall Meeting ; Conference date: 29-11-1993 Through 03-12-1993",

}

Iwase, A, Rehn, LE, Baldo, PM, Okamoto, PR, Wiedersich, H & Funk, L 1994, Reduction of defect fluxes using dual-ion-beam processing. in AF Garito, AK-Y Jen, CY-C Lee & LR Dalton (eds), Materials Synthesis and Processing Using Ion Beams. Materials Research Society Symposium Proceedings, vol. 316, Publ by Materials Research Society, pp. 57-62, Proceedings of the MRS 1993 Fall Meeting, Boston, MA, USA, 11/29/93.

Reduction of defect fluxes using dual-ion-beam processing. / Iwase, A.; Rehn, L. E.; Baldo, P. M. et al.
Materials Synthesis and Processing Using Ion Beams. ed. / Anthony F. Garito; Alex K-Y. Jen; Charles Y-C. Lee; Larry R. Dalton. Publ by Materials Research Society, 1994. p. 57-62 (Materials Research Society Symposium Proceedings; Vol. 316).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Reduction of defect fluxes using dual-ion-beam processing

AU - Iwase, A.

AU - Rehn, L. E.

AU - Baldo, P. M.

AU - Okamoto, P. R.

AU - Wiedersich, H.

AU - Funk, L.

PY - 1994

Y1 - 1994

N2 - Radiation-induced segregation (RIS) in Ni-12.7% Si and Cu-1% Au alloys was studied using Rutherford backscattering spectroscopy during He and Ne irradiation at elevated temperatures. During single ion-beam irradiation with 1.5 MeV He, strong RIS of Si toward the surface was observed in Ni-12.7% Si. Simultaneous irradiation with 400 keV Ne and 1.5 MeV He almost completely suppressed the Si segregation, even when the calculated damage production rate by Ne was only a few percent of that by He ions. A similar effect of dual-beam irradiation was observed in the Cu-1% Au alloy, i.e., the rate of near surface Au depletion was strongly reduced under simultaneous irradiation. The present result shows that dual-beam irradiation can be applied to control RIS and RED (Radiation Enhanced Diffusion) during ion beam processing.

AB - Radiation-induced segregation (RIS) in Ni-12.7% Si and Cu-1% Au alloys was studied using Rutherford backscattering spectroscopy during He and Ne irradiation at elevated temperatures. During single ion-beam irradiation with 1.5 MeV He, strong RIS of Si toward the surface was observed in Ni-12.7% Si. Simultaneous irradiation with 400 keV Ne and 1.5 MeV He almost completely suppressed the Si segregation, even when the calculated damage production rate by Ne was only a few percent of that by He ions. A similar effect of dual-beam irradiation was observed in the Cu-1% Au alloy, i.e., the rate of near surface Au depletion was strongly reduced under simultaneous irradiation. The present result shows that dual-beam irradiation can be applied to control RIS and RED (Radiation Enhanced Diffusion) during ion beam processing.

UR - https://www.scopus.com/pages/publications/0028342277

M3 - Conference contribution

AN - SCOPUS:0028342277

SN - 1558992154

T3 - Materials Research Society Symposium Proceedings

SP - 57

EP - 62

BT - Materials Synthesis and Processing Using Ion Beams

A2 - Garito, Anthony F.

A2 - Jen, Alex K-Y.

A2 - Lee, Charles Y-C.

A2 - Dalton, Larry R.

PB - Publ by Materials Research Society

T2 - Proceedings of the MRS 1993 Fall Meeting

Y2 - 29 November 1993 through 3 December 1993

ER -

Reduction of defect fluxes using dual-ion-beam processing

Abstract

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