Abstract
We report the effect of a definite miscut of yttria-stabilized zirconia (YSZ) (100) single-crystal substrates onto the number of azimuthal domain variants within epitaxial La-substituted Bi4 Ti3 O12 (BLT) ferroelectric thin films as well as within SrRu O3 electrode layers, both grown on these substrates. YSZ substrates with a miscut angle of 5° were studied, with two different directions of the miscut, viz., YSZ[001] and YSZ[011]. A reduction of the number of azimuthal domain variants by 50% was attained on substrates with a [011]-directed miscut. Due most probably to the reduced number of azimuthal domain boundaries, larger remanent polarization values were attained in BLT films when grown on miscut substrates.
Original language | English |
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Article number | 142903 |
Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 86 |
Issue number | 14 |
DOIs | |
State | Published - Apr 4 2005 |
Funding
This research was supported by Deutsche Forschungsgemeinschaft (DFG) via the Group of Researchers FOR 404 at Martin Luther University Halle-Wittenberg. One of the authors (H.N.L.) was supported by the U.S. Department of Energy under contract with the Oak Ridge National Laboratory, managed by UT-Battelle, LLC, as part of a BES NSET initiative on Nanoscale Cooperative Phenomena and of the LDRD program.
Funders | Funder number |
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BES NSET | |
U.S. Department of Energy | |
Oak Ridge National Laboratory | |
Laboratory Directed Research and Development | |
Deutsche Forschungsgemeinschaft |