Reducing azimuthal domains in (100)-or (118)-oriented ferroelectric Bi 3.25La0.75Ti3O12 films using off-cut single crystal substrates

S. K. Lee, H. N. Lee, X. H. Zhu, D. Hesse, U. Gösele

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

La-substituted Bi4Ti3O12 (BLT) epitaxial ferroelectric thin films having a reduced number of azimuthal domains were grown by pulsed laser deposition on offcut yttria-stabilized zirconia (YSZ) single crystal substrates. Crystallographic structure and electrical properties of the films grown on offcut YSZ(100) substrates with an offcut angle of 5° have been investigated. BLT films grown on [011] offcut YSZ(100) substrates covered with SrRuO3(110) electrode layers showed a considerably higher reduction of the number of azimuthal domains than those grown on SrRuO 3(110) electrode layers on [001] offcut YSZ. Higher remanent polarization values were measured in BLT films on [011] offcut YSZ(100) substrates, compared to BLT films grown on [001] offcut or exactly cut ones, most probably due to the reduced number of azimuthal domain boundaries.

Original languageEnglish
Pages (from-to)179-188
Number of pages10
JournalIntegrated Ferroelectrics
Volume68
DOIs
StatePublished - 2004

Funding

via the Group of Researchers FOR 404 at Martin-Luther-Universität Halle-Witten-berg. One of the authors (X.H.Z.) acknowledges support by the Alexander von Humboldt Foundation. This work has been supported by Deutsche Forschungsgemeinschaft (DFG)

Keywords

  • Azimuthal domains
  • BiLaTiO
  • Epitaxial thin films
  • Offcut substrates
  • Yttria-stabilized ZrO (YSZ)

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