Abstract
La-substituted Bi4Ti3O12 (BLT) epitaxial ferroelectric thin films having a reduced number of azimuthal domains were grown by pulsed laser deposition on offcut yttria-stabilized zirconia (YSZ) single crystal substrates. Crystallographic structure and electrical properties of the films grown on offcut YSZ(100) substrates with an offcut angle of 5° have been investigated. BLT films grown on [011] offcut YSZ(100) substrates covered with SrRuO3(110) electrode layers showed a considerably higher reduction of the number of azimuthal domains than those grown on SrRuO 3(110) electrode layers on [001] offcut YSZ. Higher remanent polarization values were measured in BLT films on [011] offcut YSZ(100) substrates, compared to BLT films grown on [001] offcut or exactly cut ones, most probably due to the reduced number of azimuthal domain boundaries.
Original language | English |
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Pages (from-to) | 179-188 |
Number of pages | 10 |
Journal | Integrated Ferroelectrics |
Volume | 68 |
DOIs | |
State | Published - 2004 |
Funding
via the Group of Researchers FOR 404 at Martin-Luther-Universität Halle-Witten-berg. One of the authors (X.H.Z.) acknowledges support by the Alexander von Humboldt Foundation. This work has been supported by Deutsche Forschungsgemeinschaft (DFG)
Keywords
- Azimuthal domains
- BiLaTiO
- Epitaxial thin films
- Offcut substrates
- Yttria-stabilized ZrO (YSZ)