Abstract
A method to separate the recrystallization texture components from the deformation matrix in some partially recrystallized samples using monochromatic high-energy X-ray diffraction was presented. The validity of the method was demonstrated with partially recrystallized interstitial-free steel. The analysis showed that the X-ray scale intensity factors for the cold-rolled and annealed samples was about 26%, which was in agreement with the microstructures observed.
| Original language | English |
|---|---|
| Pages (from-to) | 155-160 |
| Number of pages | 6 |
| Journal | Materials Science Forum |
| Volume | 408-412 |
| Issue number | I |
| State | Published - 2002 |
| Event | Proceedings of the 13th International Conference on Textures of Materials - Seoul, Korea, Republic of Duration: Aug 26 2002 → Aug 30 2002 |
Keywords
- Deformation
- High-Energy X-Ray
- Recrystallization
- Synchrotron Radiation
- Texture
Fingerprint
Dive into the research topics of 'Recrystallization and deformation texture components separation by high-energy x-ray diffraction'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver