Recrystallization and deformation texture components separation by high-energy x-ray diffraction

Y. D. Wang, X. L. Wang, A. D. Stoica, J. D. Almer, U. Lienert, D. R. Haeffner, T. R. Watkins

Research output: Contribution to journalConference articlepeer-review

Abstract

A method to separate the recrystallization texture components from the deformation matrix in some partially recrystallized samples using monochromatic high-energy X-ray diffraction was presented. The validity of the method was demonstrated with partially recrystallized interstitial-free steel. The analysis showed that the X-ray scale intensity factors for the cold-rolled and annealed samples was about 26%, which was in agreement with the microstructures observed.

Original languageEnglish
Pages (from-to)155-160
Number of pages6
JournalMaterials Science Forum
Volume408-412
Issue numberI
StatePublished - 2002
EventProceedings of the 13th International Conference on Textures of Materials - Seoul, Korea, Republic of
Duration: Aug 26 2002Aug 30 2002

Keywords

  • Deformation
  • High-Energy X-Ray
  • Recrystallization
  • Synchrotron Radiation
  • Texture

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