Recrystallization and deformation texture components separation by high-energy x-ray diffraction

Y. D. Wang, X. L. Wang, A. D. Stoica, J. D. Almer, U. Lienert, D. R. Haeffner, T. R. Watkins

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    A method to separate the recrystallization texture components from the deformation matrix in some partially recrystallized samples using monochromatic high-energy X-ray diffraction was presented. The validity of the method was demonstrated with partially recrystallized interstitial-free steel. The analysis showed that the X-ray scale intensity factors for the cold-rolled and annealed samples was about 26%, which was in agreement with the microstructures observed.

    Original languageEnglish
    Pages (from-to)155-160
    Number of pages6
    JournalMaterials Science Forum
    Volume408-412
    Issue numberI
    StatePublished - 2002
    EventProceedings of the 13th International Conference on Textures of Materials - Seoul, Korea, Republic of
    Duration: Aug 26 2002Aug 30 2002

    Keywords

    • Deformation
    • High-Energy X-Ray
    • Recrystallization
    • Synchrotron Radiation
    • Texture

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