Real time x-ray observation of lattice pulling during growth of epitaxial Pb (Zr,Ti)O3 films

R. V. Wang, G. B. Stephenson, D. D. Fong, F. Jiang, P. H. Fuoss, J. A. Eastman, S. K. Streiffer, K. Latifi, Carol Thompson

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Abstract

Using surface-sensitive grazing incidence synchrotron x-ray scattering and fluorescence, the authors have monitored the evolution of strain and Zr composition in situ during metal-organic chemical vapor deposition of Pb (Zr,Ti) O3 epitaxially grown on (001) SrTi O3. The Zr fraction of the growing surface increases dramatically as the film relaxes, resulting in compositional nonuniformity in the growth direction. The observed composition variation can be quantitatively explained by the lattice pulling model, which includes strain energy in the thermodynamic equilibria for growth.

Original languageEnglish
Article number221914
JournalApplied Physics Letters
Volume89
Issue number22
DOIs
StatePublished - 2006
Externally publishedYes

Funding

This work and use of the Advanced Photon Source, was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. W-31-109-ENG-38.

FundersFunder number
U.S. Department of Energy
Basic Energy SciencesW-31-109-ENG-38

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