Readiness of SiC MOSFETs for aerospace and industrial applications

Ljubisa Stevanovic, Peter Losee, Stacey Kennerly, Alexander Bolotnikov, Brian Rowden, Joe Smolenski, Maja Harfman-Todorovic, Rajib Datta, Stephen Arthur, David Lilienfeld, Tobias Schuetz, Fabio Carastro, Feng Feng Tao, David Esler, Ravi Raju, Greg Dunne, Philip Cioffi, Liang Chun Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper highlights ongoing efforts to validate performance, reliability and robustness of GE SiC MOSFETs for Aerospace and Industrial applications. After summarizing ruggedness and reliability testing performed on 1.2kV MOSFETs, two application examples are highlighted. The first demonstrates the 1.2kV device performance in a prototype high frequency 75kW Aviation motor drive. The second highlights the experimental demonstration of a 99% efficient 1.0MW solar inverter using 1.7kV MOSFET modules in a two-level topology switching at 8kHz. Both applications illustrate that SiC advantage is not only in improved performance, but also in significant system cost savings through simplifications in topology, controls, cooling and filtering.

Original languageEnglish
Title of host publicationSilicon Carbide and Related Materials 2015
EditorsFabrizio Roccaforte, Filippo Giannazzo, Francesco La Via, Roberta Nipoti, Danilo Crippa, Mario Saggio
PublisherTrans Tech Publications Ltd
Pages894-899
Number of pages6
ISBN (Print)9783035710427
DOIs
StatePublished - 2016
Externally publishedYes
Event16th International Conference on Silicon Carbide and Related Materials, ICSCRM 2015 - Sicily, Italy
Duration: Oct 4 2015Oct 9 2015

Publication series

NameMaterials Science Forum
Volume858
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference16th International Conference on Silicon Carbide and Related Materials, ICSCRM 2015
Country/TerritoryItaly
CitySicily
Period10/4/1510/9/15

Keywords

  • Aerospace
  • Applications
  • Efficiency
  • Industrial
  • Reliability
  • Ruggedness
  • SiC MOSFET

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