Abstract
A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques.
| Original language | English |
|---|---|
| Article number | 112903 |
| Journal | Applied Physics Letters |
| Volume | 93 |
| Issue number | 11 |
| DOIs | |
| State | Published - 2008 |
Funding
Research was sponsored by the Center for Nanoscale Materials Sciences (S.J., S.V.K.) Division of Materials Sciences and Engineering (S.J.), and (P.M.) Eugene P. Wigner Fellowship at the Oak Ridge National Laboratory, Office of Basic Energy Sciences, U.S. Department of Energy, under Contract No. DE-AC05-00OR22725. R. Ramesh (UC Berkeley) and M. Alexe (MPI Halle) are gratefully acknowledged for the ferroelectric samples used in this study. The BE SPM and SS-PFM are available as a part of user program at the CNMS (www.cnms.ornl.gov).