Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System

Vladimir Peplov; Alexander Aleksandrov; Willem Blokland

doi:10.1109/PPC47928.2023.10310773

Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System

Vladimir Peplov, Alexander Aleksandrov, Willem Blokland

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A new fast high voltage Ramp Generator to deflect an electron beam in the Electron Scanner is required at the Spallation Neutron Source (SNS) in the Oak Ridge National Laboratory. The Electron Scanner is used for non-destructively measuring the transverse profiles of the proton beam in the accumulator ring of the SNS [1]. The existing deflector is obsolete and needs to be replaced. A new Ramp Generator is proposed based on fast high voltage MOSFET power switches. Two configurations have been considered. One is bipolar, with two opposite polarity power supplies and one switch module or two single switches, and the other is unipolar, with one power supply and two switch modules. Schematics and performance of both options are described, and results of the prototype testing are presented in the paper.

Original language	English
Title of host publication	2023 IEEE Pulsed Power Conference, PPC 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350332339
DOIs	https://doi.org/10.1109/PPC47928.2023.10310773
State	Published - 2023
Externally published	Yes
Event	2023 IEEE Pulsed Power Conference, PPC 2023 - San Antonio, United States Duration: Jun 25 2023 → Jun 29 2023

Publication series

Name	IEEE International Pulsed Power Conference
ISSN (Print)	2158-4915
ISSN (Electronic)	2158-4923

Conference

Conference	2023 IEEE Pulsed Power Conference, PPC 2023
Country/Territory	United States
City	San Antonio
Period	06/25/23 → 06/29/23

Funding

This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The publisher acknowledges the US government license to provide public access 979-8u-n3de5r0 th3e-3D2O3E3P-u9b/l2ic3A/$cc3e1ss. 0P0la n© (0h2ttp3:/ /IeEneErgEy.gov/downloads/doe-public- access-plan).

Funders	Funder number
U.S. Department of Energy

Keywords

MOSFET power switch
deflector
electron scanner

Access to Document

10.1109/PPC47928.2023.10310773

Cite this

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title = "Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System",

abstract = "A new fast high voltage Ramp Generator to deflect an electron beam in the Electron Scanner is required at the Spallation Neutron Source (SNS) in the Oak Ridge National Laboratory. The Electron Scanner is used for non-destructively measuring the transverse profiles of the proton beam in the accumulator ring of the SNS [1]. The existing deflector is obsolete and needs to be replaced. A new Ramp Generator is proposed based on fast high voltage MOSFET power switches. Two configurations have been considered. One is bipolar, with two opposite polarity power supplies and one switch module or two single switches, and the other is unipolar, with one power supply and two switch modules. Schematics and performance of both options are described, and results of the prototype testing are presented in the paper.",

keywords = "MOSFET power switch, deflector, electron scanner",

author = "Vladimir Peplov and Alexander Aleksandrov and Willem Blokland",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 IEEE Pulsed Power Conference, PPC 2023 ; Conference date: 25-06-2023 Through 29-06-2023",

year = "2023",

doi = "10.1109/PPC47928.2023.10310773",

language = "English",

series = "IEEE International Pulsed Power Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 IEEE Pulsed Power Conference, PPC 2023",

}

Peplov, V, Aleksandrov, A & Blokland, W 2023, Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System. in 2023 IEEE Pulsed Power Conference, PPC 2023. IEEE International Pulsed Power Conference, Institute of Electrical and Electronics Engineers Inc., 2023 IEEE Pulsed Power Conference, PPC 2023, San Antonio, United States, 06/25/23. https://doi.org/10.1109/PPC47928.2023.10310773

Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System. / Peplov, Vladimir; Aleksandrov, Alexander ; Blokland, Willem.
2023 IEEE Pulsed Power Conference, PPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (IEEE International Pulsed Power Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System

AU - Peplov, Vladimir

AU - Aleksandrov, Alexander

AU - Blokland, Willem

PY - 2023

Y1 - 2023

N2 - A new fast high voltage Ramp Generator to deflect an electron beam in the Electron Scanner is required at the Spallation Neutron Source (SNS) in the Oak Ridge National Laboratory. The Electron Scanner is used for non-destructively measuring the transverse profiles of the proton beam in the accumulator ring of the SNS [1]. The existing deflector is obsolete and needs to be replaced. A new Ramp Generator is proposed based on fast high voltage MOSFET power switches. Two configurations have been considered. One is bipolar, with two opposite polarity power supplies and one switch module or two single switches, and the other is unipolar, with one power supply and two switch modules. Schematics and performance of both options are described, and results of the prototype testing are presented in the paper.

AB - A new fast high voltage Ramp Generator to deflect an electron beam in the Electron Scanner is required at the Spallation Neutron Source (SNS) in the Oak Ridge National Laboratory. The Electron Scanner is used for non-destructively measuring the transverse profiles of the proton beam in the accumulator ring of the SNS [1]. The existing deflector is obsolete and needs to be replaced. A new Ramp Generator is proposed based on fast high voltage MOSFET power switches. Two configurations have been considered. One is bipolar, with two opposite polarity power supplies and one switch module or two single switches, and the other is unipolar, with one power supply and two switch modules. Schematics and performance of both options are described, and results of the prototype testing are presented in the paper.

KW - MOSFET power switch

KW - deflector

KW - electron scanner

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U2 - 10.1109/PPC47928.2023.10310773

DO - 10.1109/PPC47928.2023.10310773

M3 - Conference contribution

AN - SCOPUS:85178998440

T3 - IEEE International Pulsed Power Conference

BT - 2023 IEEE Pulsed Power Conference, PPC 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2023 IEEE Pulsed Power Conference, PPC 2023

Y2 - 25 June 2023 through 29 June 2023

ER -

Ramp Generator for Electron Scanner in SNS Beam Profile Measurements System

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