Raman microscopic characterization of proton-irradiated polycrystalline diamond films

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    Abstract

    The microstructural effects of irradiating polycrystalline diamond films with protons was examined. The dosages ranged from 1015 to 10 17 H+/cm2. Scanning electron microscopy (SEM) and Raman microscopy were used to examine the ion implantation related changes as a function of depth. The results indicate that single crystal diamond and polycrystalline diamond exhibit similar behavior with respect to predicted vs. actual ion implant range, microstructural damage, and ion behavior both along the implant path and near the stopping location of the ions. Published by Elsevier B.V.

    Original languageEnglish
    Pages (from-to)173-178
    Number of pages6
    JournalDiamond and Related Materials
    Volume14
    Issue number2
    DOIs
    StatePublished - Feb 2005

    Funding

    This work was supported by NASA's Marshall Space Flight Center. MJL sponsored by the Division of Materials Sciences and Engineering, U. S. Department of Energy, under Contract DE-AC05-00OR22725 with UT-Battelle, LLC. Special thanks to Mr. Charles Griffith of MSFC for sample preparation and Mr. Jimmy Coston of MSFC for the SEM analysis.

    Keywords

    • Diamond film
    • Microelectromechanical Systems (MEMS)
    • Radiation-induced effects

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