@inproceedings{7ac6712d9d5e4a5c9c0e2c1af99e2f85,
title = "Rainflow algorithm based lifetime estimation of power semiconductors in utility applications",
abstract = "Rainflow algorithms are one of the best counting methods used in fatigue and failure analysis popularly used in semiconductor lifetime estimation models. However, the rainflow algorithm used in power semiconductor reliability does not consider the time dependent mean temperature calculation. The equivalent temperature calculation proposed by Nagode et al is applied to semiconductor lifetime estimation for the first time in this paper. A month long arc furnace load profile is used as a test profile to estimate temperatures in IGBT in a STATCOM for reactive compensation of load. The degradation in the life of the IGBT power device is predicted based on time dependent temperature calculation.",
keywords = "Cycle counting, STATCOM, lifetime estimation, power semiconductor reliability, rainflow algorithms",
author = "Reddy, {Lakshmi Gopi} and Tolbert, {Leon M.} and Burak Ozpineci and Pinto, {Jo{\~a}o O.P.}",
year = "2014",
doi = "10.1109/APEC.2014.6803623",
language = "English",
isbn = "9781479923250",
series = "Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2293--2299",
booktitle = "APEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition",
note = "29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014 ; Conference date: 16-03-2014 Through 20-03-2014",
}