Abstract
This document outlines the user supported post-irradiation characterization by Oak Ridge National Laboratory under the Nuclear Scientific User Facility Consolidated Innovative Nuclear Research project, “Correlative Atom Probe and Electron Microscopy Study of Radiation Induced Segregation at Low and High Angle Grain Boundaries in Steels.” Fiscal Year 2017 was the first of a two-year project combining atom probe tomography and analytical electron microscopy. Electron Backscatter Diffraction was performed on the specimens to locate high and low angle grain boundaries for specimen prepared using focused ion beam. Focused ion beam prepared lift outs were used for analytical electron microscopy of the grain boundaries using the FEI F200X Talos. This report briefly summarizes the specimen preparation and analytical electron microscopy results obtained at Oak Ridge National Laboratory’s Low Activation Materials Development and Analysis facility.
Original language | English |
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Place of Publication | United States |
DOIs | |
State | Published - 2017 |
Keywords
- 36 MATERIALS SCIENCE
- GRAIN BOUNDARIES
- STEELS
- ION BEAMS
- ELECTRON MICROSCOPY
- IRRADIATION