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Radiation effects on JFETS, MOSFETS, and bipolar transistors, as related to SSC circuit design

  • E. J. Kennedy
  • , G. T. Alley
  • , C. L. Britton
  • , P. L. Skubic
  • , B. Gray
  • , A. Wu

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Some results of radiation effects on selected junction field-effect transistors, MOS field-effect transistors, and bipolar junction transistors are pre.

Original languageEnglish
Pages (from-to)452-457
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume307
Issue number2-3
DOIs
StatePublished - Oct 1 1991

Funding

The operating environment anticipated for the Superconducting Super Collider (SSC) is a very harsh operating regime. The proposed event period of 16 ns demands very high frequency performance from electronic circuits, yet the need for thousands of circuits absolutely requires a low power operating budget. Additionally, an absolute limitation to circuit performance is the radiation due primarily to gamma and neutron bombardments that can exceed a total dose of 1 Mrad (gamma) and 1013 neutrons/cm 2 in a typical year of operation, dependent upon the distance from the beam [1]. This article reports research conducted at the Oak Ridge National Laboratory (ORNL) =1 and The University of Tennessee, Knoxville, which was primarily concerned with gamma radiation total-dose effects on * This research was funded by the DOE SSC Generic Detec-tor Program. ~*l The Oak Ridge National Laboratory is operated for the U.S. Department of Energy by Martin Marietta Energy Systems under contract No. DE-AC05-84OR21400.

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